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GS1560ACFE3 参数 Datasheet PDF下载

GS1560ACFE3图片预览
型号: GS1560ACFE3
PDF下载: 下载PDF文件 查看货源
内容描述: GS1560A / GS1561 HD - LINX -R II双率解串器 [GS1560A/GS1561 HD-LINX-R II Dual-Rate Deserializer]
分类和应用: 接口集成电路
文件页数/大小: 80 页 / 1307 K
品牌: GENNUM [ GENNUM CORPORATION ]
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GS1560A/GS1561 Data Sheet  
Table 1-1: Pin Descriptions (Continued)  
Pin  
Name  
Timing  
Type  
Description  
Number  
27  
CS_TMS  
Synchronous  
with  
Input  
CONTROL SIGNAL INPUT  
Signal levels are LVCMOS/LVTTL compatible.  
SCLK_TCK  
Chip Select / Test Mode Select  
Host Mode (JTAG/HOST = LOW)  
CS_TMS operates as the host interface chip select, CS, and is active  
LOW.  
JTAG Test Mode (JTAG/HOST = HIGH)  
CS_TMS operates as the JTAG test mode select, TMS, and is active  
HIGH.  
NOTE: If the host interface is not being used, tie this pin HIGH.  
28  
SDOUT_TDO  
Synchronous  
with  
Output  
CONTROL SIGNAL OUTPUT  
Signal levels are LVCMOS/LVTTL compatible.  
SCLK_TCK  
Serial Data Output / Test Data Output  
Host Mode (JTAG/HOST = LOW)  
SDOUT_TDO operates as the host interface serial output, SDOUT, used  
to read status and configuration information from the internal registers of  
the device.  
JTAG Test Mode (JTAG/HOST = HIGH)  
SDOUT_TDO operates as the JTAG test data output, TDO.  
29  
SDIN_TDI  
Synchronous  
with  
Input  
CONTROL SIGNAL INPUT  
Signal levels are LVCMOS/LVTTL compatible.  
SCLK_TCK  
Serial Data In / Test Data Input  
Host Mode (JTAG/HOST = LOW)  
SDIN_TDI operates as the host interface serial input, SDIN, used to write  
address and configuration information to the internal registers of the  
device.  
JTAG Test Mode (JTAG/HOST = HIGH)  
SDIN_TDI operates as the JTAG test data input, TDI.  
NOTE: If the host interface is not being used, tie this pin HIGH.  
30  
SCLK_TCK  
Non  
Input  
CONTROL SIGNAL INPUT  
Synchronous  
Signal levels are LVCMOS/LVTTL compatible.  
Serial Data Clock / Test Clock.  
Host Mode (JTAG/HOST = LOW)  
SCLK_TCK operates as the host interface burst clock, SCLK. Command  
and data read/write words are clocked into the device synchronously with  
this clock.  
JTAG Test Mode (JTAG/HOST = HIGH)  
SCLK_TCK operates as the JTAG test clock, TCK.  
NOTE: If the host interface is not being used, tie this pin HIGH.  
27360 - 8 September 2005  
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