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MC7445ARX933LF 参数 Datasheet PDF下载

MC7445ARX933LF图片预览
型号: MC7445ARX933LF
PDF下载: 下载PDF文件 查看货源
内容描述: RISC微处理器硬件规格 [RISC Microprocessor Hardware Specifications]
分类和应用: 微处理器
文件页数/大小: 64 页 / 1129 K
品牌: FREESCALE [ Freescale ]
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System Design Information  
temperature—airflow, board population (local heat flux of adjacent components), heat sink efficiency, heat sink  
attach, heat sink placement, next-level interconnect technology, system air temperature rise, altitude, etc.  
Due to the complexity and the many variations of system-level boundary conditions for today's microelectronic  
equipment, the combined effects of the heat transfer mechanisms (radiation, convection, and conduction) may vary  
widely. For these reasons, we recommend using conjugate heat transfer models for the board, as well as system-level  
designs.  
For system thermal modeling, the MPC7445 and MPC7455 thermal model is shown in Figure 30. Four volumes will  
be used to represent this device. Two of the volumes, solder ball, and air and substrate, are modeled using the  
package outline size of the package. The other two, die, and bump and underfill, have the same size as the die.  
Dimensions for these volumes for the MPC7445 and MPC7455 are given in Figure 20 and Figure 22, respectively.  
The silicon die should be modeled 9.10 × 12.25 × 0.74 mm with the heat source applied as a uniform source at the  
bottom of the volume. The bump and underfill layer is modeled as 9.10 × 12.25 × 0.069 mm (or as a collapsed  
volume) with orthotropic material properties: 0.6 W/(m • K) in the xy-plane and 2 W/(m • K) in the direction of the  
z-axis. The substrate volume is 25 × 25 × 1.2 mm (MPC7445) or 29 × 29 × 1.2 mm (MPC7455), and this volume  
has 18 W/(m • K) isotropic conductivity. The solder ball and air layer is modeled with the same horizontal  
dimensions as the substrate and is 0.9 mm thick. It can also be modeled as a collapsed volume using orthotropic  
material properties: 0.034 W/(m • K) in the xy-plane direction and 3.8 W/(m • K) in the direction of the z-axis.  
Die  
z
Bump and Underfill  
Substrate  
Conductivity  
Value  
Unit  
Solder and Air  
Bump and Underfill  
Side View of Model (Not to Scale)  
x
k
k
k
0.6  
0.6  
2
W/(m • K)  
x
y
z
Substrate  
18  
Substrate  
Die  
k
Solder Ball and Air  
k
k
k
0.034  
0.034  
3.8  
x
y
z
y
Top View of Model (Not to Scale)  
Figure 30. Recommended Thermal Model of MPC7445 and MPC7455  
MPC7455 RISC Microprocessor Hardware Specifications, Rev. 4.1  
58  
Freescale Semiconductor  
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