FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
Power-Up
TXD HIGH and EN LOW > t 35 µs)
1 (
Fast
(10 x)
TXD HIGH and EN LOW to
HIGH
Toggle Function
EN LOW for t < 5.0 µs,
2
then HIGH
LIN Bus or WAKE Pin
Wake-Up
Normal
1.0 to 20
kbps
TXD HIGH and EN LOW to HIGH
Sleep
Awake
EN LOW for t < 5.0 µs,
2
then HIGH
TXD LOW and EN
LOW to HIGH
TXD HIGH
EN LOW for t < 5.0 µs,
then HIGH
2
Slow
1.0 to 10
kbps
TXD LOW and EN LOW to HIGH
Wait Slow
Toggle Function
TXD HIGH and EN LOW > t1 (35 µs)
EN LOW for t < 5.0 µs, then HIGH
2
Fast
(10 x)
Note Refer to Table 5 for explanation.
Figure 15. Operational and Transitional Modes State Diagram
Table 5. Explanation of Operational and Transitional Modes State Diagram
Operational/
LIN
INH
EN
TXD
RXD
Transitional
Recessive state, driver off.
20 µA pullup current source.
High impedance. HIGHifexternal
pullup to V
Sleep Mode
LOW
LOW
X
DD.
Recessive state, driver off.
30 kΩ pullup active.
LOW. If external pullup, HIGH-to-
LOW transition reports wake-up.
Awake
HIGH
HIGH
LOW
HIGH
X
Driver active. 30 kΩ pullupactive.
Slew rate normal (20 kbps).
HIGH to enter Normal mode.
Once in Normal mode: LOW to
Report LIN bus level:
• Low LIN bus dominant
Normal Mode
drive LIN bus in dominant, HIGH • High LIN bus recessive
to drive LIN bus in recessive.
Recessive state. Driver off.
30 kΩ pullup active.
Wait Slow
Slow
HIGH
HIGH
HIGH
HIGH
LOW
HIGH
Driver active. 30 kΩ pullupactive.
Slew rate slow (10 kbps).
LOW to enter Slow mode. Once Report LIN bus level:
in Slow mode: LOW to drive LIN • Low LIN bus dominant
bus in dominant, HIGH to drive
LIN bus in recessive.
• High LIN bus recessive
Driver active. 30 kΩ pullup active.
LOW to drive LIN bus in
Report LIN bus level:
Fast
HIGH
HIGH
Slew rate fast (> 100 kbps).
dominant, HIGH to drive LIN bus • Low LIN bus dominant
in recessive. • High LIN bus recessive
X = Don’t care.
ELECTROMAGNETIC COMPATIBILITY
performances. Figures 16 and 17 show the results in the
frequency range 100 kHz to 2.0 MHz. Test conditions are in
accordance with CISPR25 recommendations, bus length of
RADIATED EMISSION IN NORMAL AND SLOW
MODES
The 33661 has been tested for radiated emission
33661
Analog Integrated Circuit Device Data
Freescale Semiconductor
15
FREESCALE [ Freescale ]
