V850-2106-001, V850-TBD-001 10GBPS 850NM VCSEL ARRAY
NOTES
7. Rise and fall times specifications are the 20% - 80%. Most
of the devices will measure <135ps fall time. Rise and fall
times are sensitive to drive electronics.
1. Reliability is a function of temperature, see
www.finisar.com/aoc.php for details.
2. For the purpose of these tests, I is DC current.
F
8. To compute the value of Series Resistance at a
temperature T, use the following equation:
2
3. Threshold current varies as (T – T ) . It may either
A
0
increase or decrease with temperature, depending upon
relationship of T to T . The magnitude of the change is
o
R (T) ≈ R (25 C)*[1+ΔR ΔT)*(T-25)]
S
S
S
/
A
0
proportional to the threshold at T
0.
9. Beam divergence is defined as the total included angle
2
between the 1/e intensity points.
4. Slope efficiency is defined as ΔP /ΔI .
O
F
5. To compute the value of Slope Efficiency at a temperature
T, use the following equation:
o
η(T) ≈ η(25 C)*[1+(Δη/ΔT)*(T-25)]
6. Rollover is the power at which a further current increase
does not result in a power increase.
TYPICAL PERFORMANCE CURVES
Emitted Power vs. Current: Power varies approximately
linearly with current above threshold.
Threshold Current vs. Temperature: Threshold current
varies parabolically with temperature; thus it can be nearly
constant for a limited temperature range.
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