MOC301XM, MOC302XM — 6-Pin DIP Random-Phase Optoisolators Triac Driver Output (250/400 Volt Peak)
Absolute Maximum Ratings
(T
A
= 25°C unless otherwise noted)
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
TOTAL DEVICE
T
STG
T
OPR
T
SOL
T
J
V
ISO
P
D
EMITTER
I
F
V
R
P
D
DETECTOR
V
DRM
I
TSM
P
D
Parameters
Storage Temperature
Operating Temperature
Lead Solder Temperature
Junction Temperature Range
Isolation Surge Voltage
(1)
(peak AC voltage, 60Hz, 1 sec. duration)
Total Device Power Dissipation @ 25°C Ambient
Derate above 25°C
Device
All
All
All
All
All
All
Value
-40 to +150
-40 to +85
260 for 10 sec
-40 to +100
7500
330
4.4
Units
°C
°C
°C
°C
Vac(pk)
mW
mW/°C
mA
V
mW
mW/°C
V
A
mW
mW/°C
Continuous Forward Current
Reverse Voltage
Total Power Dissipation @ 25°C Ambient
Derate above 25°C
All
All
All
60
3
100
1.33
Off-State Output Terminal Voltage
Peak Repetitive Surge Current
(PW = 1ms, 120pps)
Total Power Dissipation @ 25°C Ambient
Derate above 25°C
MOC3010M/1M/2M
MOC3020M/1M/2M/3M
All
All
250
400
1
300
4
Note:
1. Isolation surge voltage, V
ISO
, is an internal device dielectric breakdown rating. For this test, Pins 1 and 2 are
common, and Pins 4, 5 and 6 are common.
©2005 Fairchild Semiconductor Corporation
MOC301XM, MOC302XM Rev. 1.0.2
www.fairchildsemi.com
2