MOC3021, MOC3022, MOC3023
1.3
IFT, NORMALIZED LED TRIGGER CURRENT
IFT, TRIGGER CURRENT – NORMALIZED
1.4
25
20
NORMALIZED TO:
PWin 100
µs
1.2
1.1
1
q
15
0.9
0.8
10
5
0
1
0.7
0.6
–40
–20
0
20
40
60
TA, AMBIENT TEMPERATURE (°C)
80
100
2
5
10
20
PWin, LED TRIGGER WIDTH (µs)
50
100
Figure 3. Trigger Current versus Temperature
Figure 4. LED Current Required to Trigger
versus LED Pulse Width
12
10
dv/dt, STATIC (V/
µ
s)
8
6
4
2
0
25 30
I DRM, LEAKAGE CURRENT (nA)
100
STATIC dv/dt
CIRCUIT IN FIGURE 7
100
10
40
50
60
70
80
TA, AMBIENT TEMPERATURE (°C)
90
1
– 40 – 30 – 20 –10 0 10 20 30 40 50 60
TA, AMBIENT TEMPERATURE (°C)
70
80
Figure 5. dv/dt versus Temperature
Figure 6. Leakage Current, IDRM
versus Temperature
+400
Vdc
RTEST
R = 10 kΩ
PULSE
INPUT
CTEST
MERCURY
WETTED
RELAY
X100
SCOPE
PROBE
D.U.T.
1. The mercury wetted relay provides a high speed repeated
pulse to the D.U.T.
2. 100x scope probes are used, to allow high speeds and
voltages.
3. The worst–case condition for static dv/dt is established by
triggering the D.U.T. with a normal LED input current, then
removing the current. The variable RTEST allows the dv/dt to be
gradually increased until the D.U.T. continues to trigger in
response to the applied voltage pulse, even after the LED
current has been removed. The dv/dt is then decreased until
the D.U.T. stops triggering.
t
RC is measured at this point and
recorded.
Vmax = 400 V
APPLIED VOLTAGE
WAVEFORM
252 V
dv dt
t
RC
0 VOLTS
V
+
0.63 RCmax
+
252
RC
t
t
Figure 7. Static dv/dt Test Circuit
FAIRCHILD [ FAIRCHILD SEMICONDUCTOR ]
