KA79XX/KA79XXA
Absolute Maximum Ratings
Parameter
Symbol
Value
-35
Unit
V
Input Voltage
V
I
Thermal Resistance Junction-Case (Note1)
Thermal Resistance Junction-Air (Note1, 2)
Operating Temperature Range
Storage Temperature Range
Note:
R
R
5
°C/W
°C/W
°C
θJC
θJA
65
T
OPR
0 ~ +125
- 65 ~ +150
T
STG
°C
1. Thermal resistance test board
Size: 76.2mm * 114.3mm * 1.6mm(1S0P)
JEDEC standard: JESD51-3, JESD51-7
2. Assume no ambient airflow
Electrical Characteristics (KA7905)
(V = -10V, I = 500mA, 0°C ≤ T ≤ +125°C, C =2.2µF, C =1µF, unless otherwise specified.)
I
O
J
I
O
Parameter
Symbol
Conditions
Min. Typ. Max. Unit
T = +25°C
J
-4.8 -5.0 -5.2
Output Voltage
V
V
O
I
= 5mA to 1A, P 15W
O ≤
O
I
-4.75 -5.0 -5.25
V = -7V to -20V
V = -7V to -25V
-
-
35
8
100
50
I
Line Regulation (Note3)
∆V
∆V
T = +25°C
mV
O
J
V = -8V to -12V
I
T = +25°C, I = 5mA to 1.5A
-
10
3
100
50
J
O
Load Regulation (Note3)
Quiescent Current
mV
mA
mA
O
T =+25°C, I = 250mA to 750mA
-
J
O
I
T =+25°C
J
-
3
6
Q
I
= 5mA to 1A
-
0.05 0.5
O
Quiescent Current Change
∆I
Q
V = -8V to -25V
I
-
0.1
-0.4
40
0.8
Temperature Coefficient of V ∆Vo/∆T
I
= 5mA
O
-
-
-
-
-
-
-
mV/°C
µV
dB
D
Output Noise Voltage
Ripple Rejection
Dropout Voltage
Short Circuit Current
Peak Current
V
f = 10Hz to 100kHz, T = +25°C
-
N
A
RR
f = 120Hz, ∆V = 10V
54
-
60
I
V
T =+25°C, I = 1A
J
2
V
D
O
I
T =+25°C, V = -35V
-
300
2.2
mA
A
SC
J
I
I
T =+25°C
J
-
PK
Note
3. Load and line regulation are specified at constant junction temperature. Changes in V due to heating effects must be taken
O
into account separately. Pulse testing with low duty is used.
2
FAIRCHILD [ FAIRCHILD SEMICONDUCTOR ]
