Absolute Maximum Ratings (T = 25°C unless otherwise specified)
A
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
Parameter
Storage Temperature
Operating Temperature
Lead Solder Temperature
Condition
Value
Units
°C
T
-55 to +125
-55 to +100
260 for 10 sec
STG
T
°C
OPR
T
°C
SOL
EMITTER
I (avg) DC/Average Forward Input
25
50
1.0
5
mA
mA
A
F
(1)
Current Each Channel
I (pk)
Peak Forward Input Current
Each Channel
50% duty cycle, 1ms P.W.
F
(2)
I (trans) Peak Transient Input Current
≤1µs P.W., 300pps
F
Each Channel
V
Reverse Input Voltage Each
Channel
V
R
P
Input Power Dissipation Each 6N135/6N136 and HCPL2503/4502
100
45
mW
D
Channel
(3)
HCPL-2530/253
DETECTOR
I
(avg) Average Output Current Each
Channel
8
mA
mA
O
I
(pk)
Peak Output Current Each
Channel
16
O
V
Emitter-Base Reverse Voltage 6N135, 6N136 and HCPL2503 only
5
-0.5 to 30
-0.5 to 20
5
V
V
EBR
V
Supply Voltage
Output Voltage
CC
V
V
O
I
Base Current
6N135, 6N136 and HCPL2503 only
6N135, 6N136, HCPL2503, HCPL4502
HCPL2530, HCPL2531
mA
mW
mW
B
(4)
PD
Output Power Dissipation
Each Channel
100
35
Notes:
1. Derate linearly above 70°C free-air temperature at a rate of 0.8mA/°C.
2. Derate linearly above 70°C free-air temperature at a rate of 1.6mA/°C.
3. Derate linearly above 70°C free-air temperature at a rate of 0.9 mW/°C.
4. Derate linearly above 70°C free-air temperature at a rate of 2.0 mW/°C.
©2005 Fairchild Semiconductor Corporation
6N135, 6N136, HCPL2503, HCPL4502, HCPL2530, HCPL2531 Rev. 1.0.7
www.fairchildsemi.com
2
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