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FQPF13N50C 参数 Datasheet PDF下载

FQPF13N50C图片预览
型号: FQPF13N50C
PDF下载: 下载PDF文件 查看货源
内容描述: 500V N沟道MOSFET [500V N-Channel MOSFET]
分类和应用:
文件页数/大小: 10 页 / 874 K
品牌: FAIRCHILD [ FAIRCHILD SEMICONDUCTOR ]
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FQP13N50C/FQPF13N50C
QFET
FQP13N50C/FQPF13N50C
500V N-Channel MOSFET
General Description
These N-Channel enhancement mode power field effect
transistors are produced using Fairchild’s proprietary,
planar stripe, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the
avalanche and commutation mode. These devices are well
suited for high efficiency switched mode power supplies,
active power factor correction, electronic lamp ballasts
based on half bridge topology.
TM
Features
13A, 500V, R
DS(on)
= 0.48Ω @V
GS
= 10 V
Low gate charge ( typical 43 nC)
Low Crss ( typical 20pF)
Fast switching
100% avalanche tested
Improved dv/dt capability
D
!
G
!
G DS
TO-220
FQP Series
GD S
TO-220F
FQPF Series
!
S
Absolute Maximum Ratings
Symbol
V
DSS
I
D
I
DM
V
GSS
E
AS
I
AR
E
AR
dv/dt
P
D
T
J
, T
STG
T
L
T
C
= 25°C unless otherwise noted
Parameter
Drain-Source Voltage
- Continuous (T
C
= 25°C)
Drain Current
- Continuous (T
C
= 100°C)
Drain Current
- Pulsed
(Note 1)
FQP13N50C
13
8
52
FQPF13N50C
500
13 *
8*
52 *
±
30
860
13
19.5
4.5
Units
V
A
A
A
V
mJ
A
mJ
V/ns
W
W/°C
°C
°C
Gate-Source Voltage
Single Pulsed Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Power Dissipation (T
C
= 25°C)
(Note 2)
(Note 1)
(Note 1)
(Note 3)
- Derate above 25°C
Operating and Storage Temperature Range
Maximum lead temperature for soldering purposes,
1/8" from case for 5 seconds
195
1.56
-55 to +150
300
48
0.39
* Drain current limited by maximum junction temperature
Thermal Characteristics
Symbol
R
θJC
R
θJS
R
θJA
Parameter
Thermal Resistance, Junction-to-Case
Thermal Resistance, Case-to-Sink Typ.
Thermal Resistance, Junction-to-Ambient
FQP13N50C
0.64
0.5
62.5
FQPF13N50C
2.58
--
62.5
Units
°C/W
°C/W
°C/W
©2003 Fairchild Semiconductor Corporation
Rev. A, April 2003