LOW INPUT CURRENT
HIGH GAIN SPLIT
DARLINGTON OPTOCOUPLERS
SINGLE-CHANNEL
6N138
6N139
Noise
Shield
V
CC
Pulse
Generator
tr = 5ns
Z
O
= 50
$
I
F
+
Noise
Shield
V
CC
R
L
V
01
0.1 µF
V
O
C
L
= 15 µF*
DUAL-CHANNEL
HCPL-2730
HCPL-2731
Pulse
Generator I
F
tr = 5ns
Z
O
= 50
$
10% D.C.
I/
f
< 100
(
s
1
+
8
7
6
5
+5 V
1
V
F1
-
8
7
6
5
+5 V
2
V
F
-
V
B
R
L
10% DUTY CYCLE
I/f < 100 µS
V
O
2
-
3
I
F
Monitor
R
m
V
O
0.1 µF
I
F
MONITOR
Rm
C
L
= 15 µF*
3
4
V
02
V
F2
+
GND
4
GND
Test Circuit for 6N138, 6N139
Test Circuit for HCPL-2730 and HCPL-2731
I
F
0
V
O
5V
1.5 V
1.5 V
V
OL
T
PHL
T
PLH
Fig. 22 Switching Time Test Circuit
*Includes Probe and Fixture Capacitance
I
F
Noise
Shield
1
+
Noise
Shield
8
7
6
5
V
CC
+5 V
I
F
+
V
F1
-
A
1
2
3
4
8
7
6
5
V
CC
R
L
V
01
0.1 µF
+5 V
2
A
B
V
FF
V
F
-
V
B
R
L
B
V
O
0.1 µF
V
FF
V
O
3
4
+
V
CM
V
O
-
V
F2
+
V
02
GND
-
GND
-
Pulse Gen
+
V
CM
-
Pulse Gen
Test Circuit for 6N138 and 6N139
Test Circuit for HCPL-2730 and HCPL-2731
V
CM
10 V
10%
t
r
90%
90%
10%
t
f
0V
V
O
Switch at A : I
F
= 0 mA
V
O
Switch at B : I
F
= 1.6 mA
5V
V
OL
Fig. 23 Common Mode Immunity Test Circuit
12/27/99
200023A
FAIRCHILD [ FAIRCHILD SEMICONDUCTOR ]
