1,550nm MI DFB Laser
with Integrated Wavelength Locker
FLD5F20CE-E
OPTICAL & ELECTRICAL CHARACTERISTICS (Continued)
(Laser Temperature T = T
T
= 25°C, BOL, unless otherwise specified)
L
set, op
Limits
Type
Parameter
Symbol
Test Condition
Unit
Min.
Max.
DC to 5GHz, V =V , I =I
,
m
o F op
8
-
-
-
dB
dB
50Ω Test Set
RF Return Loss
S11
5 to 10GHz, V =V , I =I
,
m
o F op
5
-
50Ω Test Set
CW, I =I , V =V
F op
m
o,
Power Monitor Current
Im1
0.04
-
1.5
mA
VDR=5V
Power Monitor Dark Current
Id1
VDR=5V
-
-
2
2
100
15
nA
pF
Power Monitor Diode
Capacitance
Ct1
VDR=5V, f=10MHz
CW, I =I , V =V
F op
m
o,
Wavelength Monitor Current
Im2
Id2
0.04
-
1.5
100
15
mA
nA
pF
VDR=5V
Wavelength Monitor
Dark Current
VDR=5V
-
-
2
2
Wavelength Monitor
Diode Capacitance
Ct2
VDR=5V, f=10MHz
Wavelength Difference
between Lock Point and
Im2 peak (Note 4)
∆λ
6.0
-
44.0
GHz
Im2peak/
Im2bottom
Im2 Peak-Bottom Ratio
TEC Capacity
2.0
70-Tset
-
-
-
-
4.0
-
dB
°C
A
∆T
PTEC=5.2W, I =I
F op
TEC Current
ITEC
I =I
F op, ∆T=(70-Tset)[°C]
1.3
TEC Voltage
VTEC
PTEC
Rth
I =I
F op, ∆T=(70-Tset)[°C]
-
-
-
4.0
5.2
V
W
kΩ
K
TEC Power Dissipation
Thermistor Resistance
Thermistor B Constant
I =I
F op
-
-
TL=25°C
9.5
3270
10.5
3630
B
3450
Note 1. Eudyna Test System, 9.95328Gb/s, PRBS=223-1, I =I , V =V and (V -V
F
op
m
o
o
mod)
mod),
Note 2. Eudyna Test System, 9.95328Gb/s, PRBS=223-1, I =I , V =V and (V -V
F
op
m
o
o
Dispersion=1600ps/nm
Dispersion Penalty at Bit-Error-Rate=1.0E-10
Note 3: See Table 1 Wavelength Table
3
EUDYNA [ EUDYNA DEVICES INC ]
