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EM68932DVKB-75H 参数 Datasheet PDF下载

EM68932DVKB-75H图片预览
型号: EM68932DVKB-75H
PDF下载: 下载PDF文件 查看货源
内容描述: 4M ×32的移动DDR同步DRAM (SDRAM)的 [4M x 32 Mobile DDR Synchronous DRAM (SDRAM)]
分类和应用: 动态存储器双倍数据速率
文件页数/大小: 40 页 / 342 K
品牌: ETRON [ ETRON TECHNOLOGY, INC. ]
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EM68932DVKB  
EtronTech  
z DM Masking Function  
The DDR SDRAM has a Data Mask function that can be used in conjunction with the data write cycle only,  
not the read cycle. When the Data Mask is activated (DM High) during a write operation, the write data is  
masked immediately (DM to Data Mask latency is zero). DM must be issued at the rising edge or the falling  
edge of Data Strobe instead of at a clock edge.  
z Auto Precharge Operation  
Auto Precharge is a feature which performs the same individual bank precharge function as described  
above, but without requiring an explicit command. This is accomplished by using A10 (A10 = High), to  
enable Auto Precharge in conjunction with a specific READ or WRITE command. A precharge of the bank /  
row that is addressed with the READ or WRITE command is automatically performed upon completion of  
the read or write burst. Auto Precharge is non persistent in that it is either enabled or disabled for each  
individual READ or WRITE command. Auto Precharge ensures that a precharge is initiated at the earliest  
valid stage within a burst. The user must not issue another command to the same bank until the  
precharging time (tRP) is completed. When the Auto Precharge command is activated, the active bank  
automatically begins to precharge at the earliest possible moment during a read or write cycle after tRAS  
(min) is satisfied.  
z Precharge Command  
The Precharge command is issued when  
,
, and  
are Low and  
is High at the rising edge  
CAS  
CS RAS  
WE  
of the clock (CK). The Precharge command can be used to precharge any bank individually or all banks  
simultaneously. The Bank Select addresses (BA0, BA1) are used to define which bank is precharged when  
the command is initiated. For a write cycle, tWR (min) must be satisfied from the start of the last Burst Write  
cycle until the Precharge command can be issued. After tRP from the precharge, an Active command to the  
same bank can be initiated.  
z Auto Refresh  
An Auto Refresh command is issued by having  
,
, and  
held Low with CKE and  
High at  
WE  
CS RAS  
CAS  
the rising edge of the clock (CK). All banks must be precharged and idle for a tRP (min) before the Auto  
Refresh command is applied. The refresh addressing is generated by the internal refresh address counter.  
This makes the address bits Don’t Care during an Auto Refresh command. When the refresh cycle is  
complete, all banks will be in the idle state. A delay between the Auto Refresh command and the next  
Active command or subsequent Auto Refresh command must be greater than or equal to the tRFC (min).  
z Self Refresh  
A Self Refresh command is defined by having  
,
,
and CKE Low with  
High at the rising  
WE  
CS RAS CAS  
edge of the clock (CK). Once the Self Refresh command has been initiated, CKE must be held Low to keep  
the device in Self Refresh mode. During the Self Refresh operation, all inputs except CKE are ignored. The  
clock is internally disabled during Self Refresh operation to reduce power consumption. To exit the Self  
Refresh mode, supply a stable clock input before returning CKE high, assert Deselect or a NOP command,  
and then assert CKE high.  
z Power Down Mode  
The device enters Power Down mode when CKE is brought Low, and it exits when CKE returns High. Once  
the Power Down mode is initiated, all of the receiver circuits except CK and CKE are gated off to reduce  
power consumption. All banks should be in an idle state prior to entering the Precharge Power Down mode  
and CKE should be set high at least tXP prior to an Active command. During Power Down mode, refresh  
operations cannot be performed; therefore the device must remain in Power Down mode for a shorter time  
than the refresh period (tREF) of the device.  
Etron Confidential  
12  
Rev. 1.0  
Aug. 2009