ESMT
AC OPERATING TEST CONDITIONS
(V
DD
= 2.5V
±
0.2V
,
T
A
= 0 to 70
°
C
)
Parameter
Input levels (Vih/Vil)
Input timing measurement reference level
Input rise and fall-time
Output timing measurement reference level
Output load condition
Value
0.9xV
DDQ
/0.2
0.5xV
DDQ
tr/tf = 1/1
0.5xV
DDQ
See Fig. 2
M12S128168A
Unit
V
V
ns
V
(Fig. 1) DC Output Load Circuit
(Fig. 2) AC Output Load Circuit
OPERATING AC PARAMETER
(AC operating conditions unless otherwise noted)
Parameter
Row active to row active delay
RAS to CAS delay
Row precharge time
Row active time
@ Operating
Row cycle time
@ Auto refresh
Symbol
-6
t
RRD(min)
t
RCD(min)
t
RP(min)
t
RAS(min)
t
RAS(max)
t
RC(min)
t
RFC(min)
t
CDL(min)
t
RDL(min)
t
BDL(min)
t
REF(max)
58
60
12
18
18
40
Version
-7
14
20
20
42
100
63
70
1
2
1
64
90
100
-8
20
30
30
60
ns
ns
ns
ns
us
ns
ns
t
CK
t
CK
t
CK
ms
1
1,5
2
2
2
6
1
1
1
1
Unit
Note
Last data in to col. address delay
Last data in to row precharge
Last data in to burst stop
Refresh period (4,096 rows)
Elite Semiconductor Memory Technology Inc.
Publication Date: Apr. 2008
Revision: 1.1
6/45