ESMT
AC OPERATING TEST CONDITIONS
(V
DD
= 3.3V
±
0.3V,T
A
= -40 to 85
°
C
)
Parameter
Input levels (Vih/Vil)
Input timing measurement reference level
Input rise and fall-time
Output timing measurement reference level
Output load condition
Value
2.4/0.4
1.4
tr/tf = 1/1
1.4
See Fig. 2
M12L128168A
Operation temperature condition -40
°
C ~85
°
C
Unit
V
V
ns
V
3.3V
1200
Output
870
Ω
50pF
Vtt = 1.4V
Ω
V
OH
(DC) =2.4V , I
OH
= -2 mA
V
OL
(DC) =0.4V , I
OL
= 2 mA
Output
Z0 =50
50
Ω
Ω
50pF
(Fig. 1) DC Output Load Circuit
(Fig. 2) AC Output Load Circuit
OPERATING AC PARAMETER
(AC operating conditions unless otherwise noted)
Version
Parameter
Row active to row active delay
RAS to CAS delay
Row precharge time
Row active time
@ Operating
@ Auto refresh
Symbol
-5
t
RRD(min)
t
RCD(min)
t
RP(min)
t
RAS(min)
t
RAS(max)
t
RC(min)
t
RFC(min)
t
CDL(min)
t
RDL(min)
t
BDL(min)
t
REF(max)
53
55
10
15
15
38
-6
12
18
18
40
100
58
60
1
2
1
64
63
70
-7
14
20
20
42
ns
ns
ns
ns
us
ns
ns
t
CK
t
CK
t
CK
ms
1
1,5
2
2
2
6
1
1
1
1
Unit
Note
Row cycle time
Last data in to col. address delay
Last data in to row precharge
Last data in to burst stop
Refresh period (4,096 rows)
Elite Semiconductor Memory Technology Inc.
Publication Date: Oct. 2007
Revision: 1.2
5/43