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F49L004UA-90N 参数 Datasheet PDF下载

F49L004UA-90N图片预览
型号: F49L004UA-90N
PDF下载: 下载PDF文件 查看货源
内容描述: 4兆位( 512K ×8 )只有3V CMOS闪存 [4 Mbit (512K x 8) 3V Only CMOS Flash Memory]
分类和应用: 闪存存储
文件页数/大小: 46 页 / 354 K
品牌: ESMT [ ELITE SEMICONDUCTOR MEMORY TECHNOLOGY INC. ]
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EFST
preliminary
F49L004UA / F49L004BA
Reset Mode :
Hardware Reset (for 40-TSOP package
)
When the
RESET
pin is driven low for at least a period
of t
RP
, the device immediately terminates any operation
in progress, tri-states all output pins, and ignores all
read/write commands for the duration of the
RESET
pulse. The device also resets the internal state machine
to reading array data. The operation that was
interrupted should be reinitiated later once the device is
ready to accept another command sequence, to ensure
the data integrity.
The current is reduced for the duration of the
RESET
pulse. When
RESET
is held at V
SS
±0.3V, the device
draws CMOS standby current (I
CC4
). If
RESET
is held
at V
IL
but not within V
SS
±0.3V, the standby current will be
greater.
The
RESET
pin may be tied to system reset circuitry. A
system reset would thus reset the Flash memory,
enabling the system to read the boot-up firm-ware from
the Flash memory.
If
RESET
is asserted during a program or erase
embedded algorithm operation, the RY/
BY
pin remains
a "0" (busy) until the internal reset operation is
complete, which requires a time of t
READY
(during
Embedded Algorithms). The system can thus monitor
RY/
BY
to determine whether the reset operation is
complete.
If
RESET
is asserted when a program or erase
operation is not executing , i.e. the RY/
BY
is “1”, the
reset operation is completed within a time of t
READY
(not
during Embedded Algorithms). The system can read
data after t
RH
when the
RESET
pin returns to V
IH
. Refer
to the AC Characteristics tables for Hardware Reset
section.
valid addresses on the device address inputs produce
valid data on the device data outputs. The device remains
enabled for read access until the command register
contents are altered.
See “Read Command” section for more information. Refer
to the AC Read Operations table for timing specifications
and to Figure 5 for the timing diagram. I
CC1
in the DC
Characteristics table represents the active current
specification for reading array data.
Write Mode
To write a command or command sequence (which
includes programming data to the device and erasing
sectors of memory), the system must drive
WE
and
CE
to V
IL
, and
OE
to V
IH
. The “Program Command” section
has details on programming data to the device using
standard command sequences.
An erase operation can erase one sector, multiple
sectors, or the entire device. Tables 1 and 2 indicate the
address space that each sector occupies. A “sector
address” consists of the address bits required to uniquely
select a sector. The “Software Command Definitions”
section has details on erasing a sector or the entire chip,
or suspending/resuming the erase operation.
When the system writes the auto-select command
sequence, the device enters the auto-select mode. The
system can then read auto-select codes from the internal
register (which is separate from the memory array) on
DQ7–DQ0. Standard read cycle timings apply in this
mode. Refer to the Auto-select Mode and Auto-select
Command sections for more information. I
CC2
in the DC
Characteristics table represents the active current
specification for the write mode. The “AC Characteristics”
section contains timing specification tables and timing
diagrams for write operations.
Read Mode
To read array data from the outputs, the system must
drive the
CE
and
OE
pins to V
IL
.
CE
is the power
control and selects the device.
OE
is the output control
and gates array data to the output pins.
WE
should
remain at V
IH
. The internal state machine is set for
reading array data upon device power-up, or after a
hardware reset. This ensures that no spurious alteration
of the memory content occurs during the power
transition.
No command is necessary in this mode to obtain array
data. Standard microprocessor’s read cycles that assert
Automatic Sleep Mode
The automatic sleep mode minimizes Flash device energy
consumption. The device automatically enables this mode
when addresses remain unchanged for over 250ns ns.
The automatic sleep mode is independent of the
CE
,
WE
, and
OE
control signals. Standard address access
timings provide new data when addresses are changed.
While in sleep mode, output data is latched and always
available to the system. I
CC4
in the DC Characteristics
table represents the automatic sleep mode current
specification.
Elite Flash Storage Technology Inc.
Publication Date : Aug. 2003
Revision: 0.2
7/46