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EN25Q128-104FIP 参数 Datasheet PDF下载

EN25Q128-104FIP图片预览
型号: EN25Q128-104FIP
PDF下载: 下载PDF文件 查看货源
内容描述: 128兆位串行闪存与4K字节扇区制服 [128 Megabit Serial Flash Memory with 4Kbyte Uniform Sector]
分类和应用: 闪存
文件页数/大小: 57 页 / 1077 K
品牌: EON [ EON SILICON SOLUTION INC. ]
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EN25Q128  
Table 3. Protected Area Sizes Sector Organization  
Status Register Content  
Memory Content  
BP3 BP2 BP1 BP0  
Protect Areas  
Addresses  
None  
000000h-FEFFFFh 16320KB  
000000h-FDFFFFh 16256KB  
000000h-FBFFFFh 16128KB  
Density(KB)  
None  
Portion  
Bit  
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
Bit  
0
0
0
0
1
1
1
1
0
0
0
0
1
1
1
1
Bit  
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
Bit  
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
None  
None  
Block 0 to 254  
Block 0 to 253  
Block 0 to 251  
Block 0 to 247  
Block 0 to 239  
Block 0 to 223  
All  
Lower 255/256  
Lower 254/256  
Lower 252/256  
Lower 248/256  
Lower 240/256  
Lower 224/256  
All  
000000h-F7FFFFh  
15872KB  
000000h-EFFFFFh 15360KB  
000000h-DFFFFFh 14336KB  
000000h-FFFFFFh 16384KB  
None  
None  
None  
None  
Block 255 to 1  
Block 255 to 2  
Block 255 to 4  
Block 255 to 8  
Block 255 to 16 FFFFFFh-100000h 15360KB  
Block 255 to 32 FFFFFFh-200000h 14336KB  
FFFFFFh-010000h 16320KB  
FFFFFFh-020000h 16256KB  
FFFFFFh-040000h 16128KB  
FFFFFFh-080000h 15872KB  
Upper 255/256  
Upper 254/256  
Upper 252/256  
Upper 248/256  
Upper 240/256  
Upper 224/256  
All  
All  
FFFFFFh-000000h 16384KB  
INSTRUCTIONS  
All instructions, addresses and data are shifted in and out of the device, most significant bit first. Serial  
Data Input (DI) is sampled on the first rising edge of Serial Clock (CLK) after Chip Select (CS#) is  
driven Low. Then, the one-byte instruction code must be shifted in to the device, most significant bit first,  
on Serial Data Input (DI), each bit being latched on the rising edges of Serial Clock (CLK).  
The instruction set is listed in Table 4. Every instruction sequence starts with a one-byte instruction  
code. Depending on the instruction, this might be followed by address bytes, or by data bytes, or by  
both or none. Chip Select (CS#) must be driven High after the last bit of the instruction sequence has  
been shifted in. In the case of a Read Data Bytes (READ), Read Data Bytes at Higher Speed  
(Fast_Read), Dual Output Fast Read (3Bh), Dual I/O Fast Read (BBh), Quad Input/Output  
FAST_READ (EBh), Read Status Register (RDSR) or Release from Deep Power-down, and Read  
Device ID (RDI) instruction, the shifted-in instruction sequence is followed by a data-out sequence.  
Chip Select (CS#) can be driven High after any bit of the data-out sequence is being shifted out.  
In the case of a Page Program (PP), Sector Erase (SE), Block Erase (BE), Chip Erase (CE), Write  
Status Register (WRSR), Write Enable (WREN), Write Disable (WRDI) or Deep Power-down (DP)  
instruction, Chip Select (CS#) must be driven High exactly at a byte boundary, otherwise the instruction  
is rejected, and is not executed. That is, Chip Select (CS#) must driven High when the number of clock  
pulses after Chip Select (CS#) being driven Low is an exact multiple of eight. For Page Program, if at  
any time the input byte is not a full byte, nothing will happen and WEL will not be reset.  
In the case of multi-byte commands of Page Program (PP), and Release from Deep Power Down  
(RES ) minimum number of bytes specified has to be given, without which, the command will be  
ignored.  
In the case of Page Program, if the number of byte after the command is less than 4 (at least 1  
data byte), it will be ignored too. In the case of SE and BE, exact 24-bit address is a must, any  
less or more will cause the command to be ignored.  
All attempts to access the memory array during a Write Status Register cycle, Program cycle or Erase  
cycle are ignored, and the internal Write Status Register cycle, Program cycle or Erase cycle continues  
unaffected.  
This Data Sheet may be revised by subsequent versions  
or modifications due to changes in technical specifications.  
©2004 Eon Silicon Solution, Inc., www.eonssi.com  
14  
Rev. J, Issue Date: 2011/09/19