R
EM3027
Parameter
Dynamic current
SPI Interface
Symbol
I
DD
Test Conditions
SCK = 200 kHz
(See Note 2)
SCK = 1 MHz
(See Note 2)
SCK = 1 MHz
(See Note 2)
Relative to V
CC
Relative to V
CC
V
CC
with respect to V
Back
=
3.0V
CS, CLKOE, SI, SCL/SCK,
SDA
0.0 < V
IN
< V
CC
I
OL
= 0.4 mA
I
OH
= 0.1 mA
I
OL
= 1.5 mA
I
OH
= 1.5 mA
I
OL
= 5.0 mA
I
OH
= 2.0 mA
1.4 to 5.0
1.4 to 5.0
-40 to 85
-40 to 125
-40 to 125
V
CC
1.4
3.3
5.0
Temp. °C
-40 to 85
-40 to 125
-40 to 85
-40 to 125
-40 to 85
-40 to 125
-40 to 125
-40 to 125
-40 to 125
Min
Typ
Max
14
18
50
55
65
75
2.1
1.4
20
0.2V
CC
0.8V
CC
-1
-1.5
1
1.5
0.2
1.4
1.0
0.25
3.3
-40 to 125
2.7
0.8
5.0
-40 to 125
4.5
-1
-1.5
1.2
0.5
1
0.5
13.5
pF
25
25
25
25
25
-40 to 85
-40 to 125
13.5
80
20
5.0
1.5
+/- 1
+/- 1
+/- 3
+/- 6
3
3
2
1
1.5
V
V
V
Unit
µA
Low supply detection
level1
Low supply detection
level2
Switchover hysteresis
Input Parameters
Low level input voltage
High level input voltage
Input Leakage
Output Parameters
Low level output voltage
High level output
voltage
Low level output voltage
High level output
voltage
Low level output voltage
High level output
voltage
Output HiZ leakage on
INT
Oscillator
Start-up voltage
Start-up time
V
low1
V
low2
V
hyst
V
IL
V
IH
I
IN
V
OL
V
OH
V
OL
V
OH
V
OL
V
OH
I
LEAK_OUT
V
STA
T
STA
1.8
1.0
V
V
mV
V
1.4 to 5.0
µA
INT not active
T
STA
< 10s
1.4 to 5.0
-40 to 85
-40 to 125
-40 to 125
-40 to 85
-40 to 125
25
25
µA
V
s
s
ppm/
V
5.0
1.8V
≤
V
CC
≤
5.5V, T
A
=
+25°C
T
A
= +25°C, f = 32.768kHz,
V
meas
= 0.3V (Note 3)
T
A
= +25°C, f = 32.768kHz,
V
meas
= 0.3V (Note 3)
V
CC
=5.0V, V
Back
=3.0V
V
CC
=5.0V, V
Back
=3.0V
V
CC
=5.0V, V
Back
=3.0V
V
CC
=5.0V, V
Back
=3.0V
V
low1
< V
CC
≤
5.5V
Frequency stability over
voltage
Input capacitance on X1
Output capacitance
on X2
Trickle Charger
Current limiting
Resistors
Δf/(f ΔV)
C
IN
C
OUT
R80k
R20k
R5k
R1.5k
T
E
kΩ
Thermometer
Precision
Table 7
The following parameters are tested during production test: I
DD
, V
low1
, V
low2
, V
IL
, V
IH
, V
OL
, V
OH
, I
IN
, I
LEAK_OUT
The parameters I
CC
, V
hyst
, V
STA
, T
STA
, C
IN
, C
OUT
,
Δ
f/(f*
Δ
V), T
E
are characterised during the qualification of the IC.
Notes:
1. SDA = V
SS
, continuous clock applied at SCL (V
IL_SCL
< 0.05V, V
IH_SCL
> 0.95V
CC
)
2. CS, SI = V
CC
, continuous clock applied at SCK, SO not connected. (V
IL_SCK
< 0.05V
CC
, V
IH_SCK
> 0.95V
CC
)
Note that there is a 100kΩ pull-down resistor on CS.
3. V
meas
: Peak to peak amplitude during capacitance measurement
Copyright © 2009, EM Microelectronic-Marin SA
12/09 – rev D
°C
5
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