EM25LV010
1 Megabit (128K x 8) Serial Flash Memory
SPECIFICATION
0.8VCC
0.2VCC
0.7VCC
0.3VCC
Figure 5: AC Measurement I/O Waveform
Symbol
VOUT
Parameter
Test Condition
VOUT=0V
Min
Max
Unit
pF
Output Capacitance (Q)
Input
8
6
CIN
VIN=0V
pF
Note: Sampled only, not 100% tested, at TA=25°C and a frequency of 20MHz.
Table 12: Capacitance
Test Condition
Symbol
Parameter
Min
Max
Unit
(in addition to those in Table 10)
ILI
Input Leakage Current
Output Leakage Current
Standby Current
±2
±2
50
5
µA
µA
µA
µA
mA
ILO
ICC1
ICC2
ICC3
S#=VCC, VIN=VSS or VCC
S#=VCC, VIN=VSS or VCC
Deep Power-down Current
Operating Current (Read)
C=0.1 VCC/0.9 VCC at 25MHz,
Q=open
4
ICC4
ICC5
ICC6
ICC7
VIL
Operating Current (PP)
Operating Current (WRSR)
Operating Current (BE)
Operating Current (CE)
Input Low Voltage
S#=VCC
S#=VCC
S#=VCC
S#=VCC
15
15
mA
mA
mA
mA
V
15
15
-0.5
0.3 VCC
VCC+0.4
0.4
VIH
Input High Voltage
0.7VCC
V
VOL
VOH
Output Low Voltage
Output High Voltage
IOL=1.6mA
V
IOH=-100µA
VCC-0.2
V
Table 13: DC Characteristics
This specification is subject to change without further notice. (11.08.2004 V1.0)
Page 21 of 30
ELAN [ ELAN MICROELECTRONICS CORP ]
