Triple 60mA Linear LED Controller
Preliminary Information - Jan 21, 2015
E522.84/85/86/87
5.5 RUN Interface and Diagnostics
Diagnostic features provided in E522.8x include the monitoring of
High impedant IR driver (e.g. in case of ‘open’ connection for the external configuration resistor)
Short-circuit at IR driver to GND
Short circuit of LEDx to GND for each channel (checking for a static threshold of VLEDx,SHORT
)
Open LEDx connections for each channel. E522.8x family members provide different thresholds of VVS to enable this
monitor, thus avoiding wrong ‘OPEN’ error detection in case VVS is smaller than the forward voltage VLED of the LEDs
Internal junction overtemperature (disabling all channels)
VVS voltage monitoring for undervoltage (providing defined behavior for slow supply ramping)
The LEDx driver ‘open’ detection is relative to the actual current configured at IRx. This detection is active if the supply VVS is
higher than VVS,DIAGx, which is a family member specific threshold.
If a defect at any of the channels is detected, it is stored for selective re-diagnosis. Dimming at ENA does not delete this infor-
mation. A diagnosis cycle showing removal of the erroneous conditions or VS undervoltage reset the stored flag to ‘0’.
Re-diagnosis in case of continuous operation is performed on a regular time-basis of tERR,REDIAG to allow replacement of defect
loads / LEDs for such applications.
A loss of VS connection for a single E522.8x is propagated via RUN being set to low, as well as for ENA being ‘low’ (e.g. in case
of ‘OPEN’ failure at ENA).
This document contains information on a pre-production product. Elmos Semiconductor AG reserves the right to change specifications and information herein without notice.
Elmos Semiconductor AG
Data Sheet
QM-No.: 25DS0137E.00
12/20
ELMOS [ ELMOS SEMICONDUCTOR AG ]
