EL2257C/EL2357C
125 MHz Single Supply, Clamping Op Amps
Closed Loop AC Electrical Characteristics
VS=+5V, GND=0V, TA=25°C, VCM=+1.5V, VOUT=+1.5V, VCLAMP=+5V, VENABLE=+5V, AV=+1, RF=0Ω, RL=150Ω to GND pin,
unless otherwise specified [1]
Test
Parameter
Description
Test Conditions
VS=+5V, AV=+1, RF=0Ω
Min
Typ
125
60
Max
Level
Units
MHz
MHz
MHz
MHz
MHz
MHz
MHz
MHz
MHz
MHz
°
BW
-3 dB Bandwidth (Vout=400 mVp-p)
V
V
V
V
V
V
V
V
V
V
V
I
VS=+5V, AV=-1, RF=500Ω
VS=+5V, AV=+2, RF=500Ω
VS=+5V, AV=+10, RF=500Ω
VS=+12V, AV=+1, RF=0Ω
VS=+3V, AV=+1, RF=0Ω
VS=+12V, AV=+1, RF=0Ω
VS=+5V, AV=+1, RF=0Ω
VS=+3V, AV=+1, RF=0Ω
VS=+12V, @ AV=+10
60
6
150
100
25
BW
±0.1 dB Bandwidth (Vout=400 mVp-p)
30
20
GBWP
PM
Gain Bandwidth Product
Phase Margin
60
RL=1 kΩ, CL=6 pF
55
SR
Slew Rate
VS=+10V, RL=150Ω, Vout=0V to +6V
VS=+5V, RL=150Ω, Vout=0V to +3V
±0.1V Step
200
275
300
2.8
10
V/µs
V/µs
ns
V
V
V
V
V
V
V
V
V
tR,tF
OS
tPD
tS
Rise Time, Fall Time
Overshoot
±0.1V Step
%
Propagation Delay
0.1% Settling Time
0.01% Settling Time
Differential Gain [2]
Differential Phase [2]
Input Noise Voltage
±0.1V step
3.2
40
ns
VS=±5V, RL=500Ω, AV=+1, VOUT=±3V
VS=±5V, RL=500Ω, AV=+1, VOUT=±3V
AV=+2, RF=1 kΩ
ns
75
ns
dG
dP
eN
0.05
0.05
48
%
AV=+2, RF=1 kΩ
°
f=10 kHz
nV/ÐH
z
iN
Input Noise Current
Disable Time [3]
f=10 kHz
1.25
V
pA/ÐH
z
tDIS
tEN
tCL
50
25
7
V
V
V
ns
ns
ns
[3]
Enable Time
Clamp Overload Recovery
1. All AC tests are performed on a “warmed up” part, except slew rate, which is pulse tested.
2. Standard NTSC signal = 286 mVp-p, f=3.58 MHz, as VIN is swept from 0.6V to 1.314V. RL is DC coupled.
3. Disable/Enable time is defined as the time from when the logic signal is applied to the ENABLE pin to when the supply current has reached half its
final value.
4
ELANTEC [ ELANTEC SEMICONDUCTOR ]
