EL2002C
Low Power 180 MHz Buffer Amplifier
Absolute Maximum Ratings
V
S
V
IN
I
IN
P
D
Supply Voltage (V
a
b
V
b
)
Input Voltage (Note 1)
Input Current (Note 1)
Power Dissipation (Note 2)
Output Short Circuit
Duration (Note 3)
g
18V or 36V
g
15V or V
S
g
50 mA
T
A
T
J
T
ST
See Curves
Continuous
Operating Temperature Range
EL2002AC EL2002C
Operating Junction Temperature
Storage Temperature
0 C to
a
75 C
150 C
b
65 C to
a
150 C
Important Note
All parameters having Min Max specifications are guaranteed The Test Level column indicates the specific device testing actually
performed during production and Quality inspection Elantec performs most electrical tests using modern high-speed automatic test
equipment specifically the LTX77 Series system Unless otherwise noted all tests are pulsed tests therefore T
J
e
T
C
e
T
A
Test Level
I
II
III
IV
V
Test Procedure
100% production tested and QA sample tested per QA test plan QCX0002
100% production tested at T
A
e
25 C and QA sample tested at T
A
e
25 C
T
MAX
and T
MIN
per QA test plan QCX0002
QA sample tested per QA test plan QCX0002
Parameter is guaranteed (but not tested) by Design and Characterization Data
Parameter is typical value at T
A
e
25 C for information purposes only
Electrical Characteristics
V
S
e
g
15V
Parameter
Description
V
IN
V
OS
Offset Voltage
EL2002A EL2002AC
EL2002 EL2002C
0
Load
%
R
S
e
50X unless otherwise specified
Limits
Min
b
15
b
20
b
40
b
50
b
10
b
15
b
15
b
20
Test Conditions
Temp
25 C
T
MIN
T
MAX
0
%
25 C
T
MIN
T
MAX
I
IN
Input Current
EL2002A EL2002AC
EL2002 EL2002C
0
%
25 C
T
MIN
T
MAX
0
%
25 C
T
MIN
T
MAX
R
IN
Input Resistance
a
12V
EL2002AC
EL2002C
Max
a
15
a
20
Typ
5
Test
Level
I
III
I
III
I
III
I
III
I
III
Units
mV
mV
mV
mV
mA
mA
mA
mA
MX
MX
V V
TD is 3 3in
V V
V V
V V
10
a
40
a
50
3
a
10
a
15
5
a
15
a
20
100X
25 C
T
MIN
T
MAX
1
01
0 990
0 985
0 85
0 83
3
A
V1
Voltage Gain
g
12V
%
25 C
T
MIN
T
MAX
0 998
I
III
A
V2
Voltage Gain
g
10V
100X
25 C
T
MIN
T
MAX
0 93
I
III
2
ELANTEC [ ELANTEC SEMICONDUCTOR ]
