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EL1056ACM 参数 Datasheet PDF下载

EL1056ACM图片预览
型号: EL1056ACM
PDF下载: 下载PDF文件 查看货源
内容描述: 单片高速引脚驱动器 [Monolithic High-Speed Pin Driver]
分类和应用: 外围驱动器驱动程序和接口接口集成电路光电二极管局域网
文件页数/大小: 16 页 / 312 K
品牌: ELANTEC [ ELANTEC SEMICONDUCTOR ]
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EL1056AC EL1056C
Monolithic High-Speed Pin Driver
Absolute Maximum Ratings
(T
A
e
25 C)
Voltage between V
a
and V
b
Supply Voltage
Supply Voltage
Supply Voltage
Input Current
Input Voltage
Power-Down Mode
Input Voltage
Shunt
a
Shunt
b
Input Voltage
Data Data Input Voltages
OE OE
Input Voltages
V
S
V
b
B
a
B
b
I
SR
V
SR
a
33V
b
18V
V
INH
to V
a
V
b
to V
INL
E E
Sense
V
INH
V
INL
I
OUT
T
J
T
A
T
ST
P
D
Input Voltages
Output Voltage
Input Voltage
Input Voltage
Output Current
Junction Temperature
Operating Ambient Temperature
Range
Storage Temperature
Power Dissipation (T
A
e
25 C)
(See Curves)
0 mA to 3 mA
b
0 3V to
a
6V
(B
a
)
b
5V to B
a
B
b
to (B
b
)
a
5V
V
b
to V
a
or
g
6V Differential
V
b
to V
a
or
g
6V Differential
V
b
to V
a
or
g
6V Differential
V
b
to V
a
V
INL
b
0 3V to B
a
B
b
to V
INH
a
0 3V
b
60 mA to
a
60 mA
150 C
b
0 C to
a
75 C
b
65 C to
a
150 C
3 1W
Important Note
All parameters having Min Max specifications are guaranteed The Test Level column indicates the specific device testing actually
performed during production and Quality inspection Elantec performs most electrical tests using modern high-speed automatic test
equipment specifically the LTX77 Series system Unless otherwise noted all tests are pulsed tests therefore T
J
e
T
C
e
T
A
Test Level
I
II
III
IV
V
Test Procedure
100% production tested and QA sample tested per QA test plan QCX0002
100% production tested at T
A
e
25 C and QA sample tested at T
A
e
25 C
T
MAX
and T
MIN
per QA test plan QCX0002
QA sample tested per QA test plan QCX0002
Parameter is guaranteed (but not tested) by Design and Characterization Data
Parameter is typical value at T
A
e
25 C for information purposes only
DC Electrical Characteristics
T
A
e
25 C V
a e
B
a e
15V V
b e
B
b e b
10V R
SHUNT
a
e
R
SHUNT
b
e
6 5X no load Data E and OE from
b
1 6V to
b
0 8V I
SR
e
800
mA
V
INH
e
5V V
INL
e b
1 6V
Parameter
I
S
I
S
dis
I
VINH
I
VINL
I
DATA
I
OE
I
E
V
SR
I
SHUNT
a
I
SHUNT
b
V
SHUNT
a
V
SHUNT
b
I
SENSE
V
OS
Sense Threshold at Shunts
Sense Output Currents
Output Offset Data High V
INH
e
0V V
INL
e b
1 6V
Data Low V
INL
e
0V V
INH
e
5V
160
1
b
50
b
100
Description
(V
a
)
a
(B
a
) (V
b
)
a
(B
b
) Supply Currents
(V
a
)
a
(B
a
) (V
b
)
a
(B
b
) Supply Currents Disabled
Min
Typ
52
17
Max
60
25
20
20
30
30
20
40
7
250
2
50
100
Test
Level
I
I
I
I
I
I
I
I
I
I
I
I
I
Units
mA
mA
mA
mA
mA
mA
mA
mV
mA
mV
mA
mV
mV
TD is 2 7in
b
20
b
20
b
30
b
3
2
b
15
b
14
OE Input Current
E Input Current
Voltage at I
SR
Pin
b
30
b
20
7
20
4
200
15
0
2