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4N54 参数 Datasheet PDF下载

4N54图片预览
型号: 4N54
PDF下载: 下载PDF文件 查看货源
内容描述: HERMETIC ,数值和十六进制 [HERMETIC , NUMERIC AND HEXADECIMAL]
分类和应用:
文件页数/大小: 7 页 / 135 K
品牌: E-OEC [ OPTO ELECTRONICS CO,. LTD ]
 浏览型号4N54的Datasheet PDF文件第1页浏览型号4N54的Datasheet PDF文件第2页浏览型号4N54的Datasheet PDF文件第3页浏览型号4N54的Datasheet PDF文件第4页浏览型号4N54的Datasheet PDF文件第5页浏览型号4N54的Datasheet PDF文件第6页  
4N51, 4N52,  
67023 4N53, 4N54  
HERMETIC, NUMERIC AND HEXIDECIMAL DISPLAYS  
TABLE III  
GROUP B, CLASS A AND B OF MIL-PRF-87157  
Test  
Subgroup 1  
MIL-PRF-750  
Conditions  
Sample Size  
Method  
Resistance to Solvents  
1022  
2075  
4 Devices / 0 Failures  
1 Device / 0 Failures  
Internal Visual and Mechanical (10)  
Subgroup 2(1,2)  
Solderability  
2026  
LTPD = 15  
LTPD = 15  
TA = 245°C for 5 seconds  
Subgroup 3  
Thermal Shock (Temp. Cycle)  
Moisture Resistance(3)  
Fine Leak  
1051  
1021  
1071  
1071  
------  
Condition B1, 15 Min. Dwell  
Condition H  
Gross Leak  
Condition C  
Electrical / Optical Endpoints(4)  
IV, ICC, IBL, IBH, IEL, IEH, IIL, IIH and  
visual function. TA = 25°C  
Subgroup 4  
Operating Life Test (340 hrs.)(5)  
TA = 100°C, at VCC = 5.0V and  
cycling through logic at 1 character  
per second.  
1027  
------  
LTPD = 10  
Electrical / Optical Endpoints(4)  
Subgroup 5  
Same as Subgroup 3  
Non-operating (Storage) Life  
Test (340 hrs.)  
1032  
------  
LTPD = 10  
TA = 125°C  
Electrical / Optical Endpoints(4)  
Same as Subgroup 3  
TABLE IV  
GROUP C, CLASS A AND B OF MIL-PRF-87157  
Test  
MIL-PRF-750  
Conditions  
Sample Size  
Method  
Subgroup 1  
Physical Dimensions  
2066  
2 Devices / 0 Failures  
LTPD = 15  
Subgroup 2(2, 10)  
Lead Integrity  
Fine Leak  
2004  
1071  
1071  
Condition B2  
Condition H  
Condition C  
Gross Leak  
Subgroup 3  
Shock  
2016  
1500G, Time = 0.5 ms, 5 blows in  
each orientation X1, Y1, Z1  
LTPD = 15  
Vibration, Variable Frequency  
Constant Acceleration  
2056  
2006  
10,000G at Y1 orientation  
External Visual(7)  
1010 or 1011  
------  
Electrical / Optical Endpoints(4)  
IV, ICC, IBL, IBH, IEL, IEH, IIL, IIH and  
visual function. TA = 25°C  
Subgroup 4(1,6)  
Salt Atmosphere  
External Visual(7)  
Subgroup 5  
1041  
LTPD = 15  
1010 or 1011  
Bond Strength(8)  
Subgroup 6  
2037  
Condition A  
LTPD = 20 (c = 0)  
LTPD = 10  
Operating Life Test(9)  
1026  
------  
TA = +100°C 1000 HRS  
Electrical / Optical Endpoints(4)  
Same as Subgroup 3  
NOTES: 1. Whenever electrical/optical tests are not required as endpoints, electrical rejects may be used.  
2. The LTPD applies to the number of leads inspected, except in no case shall less than 3 displays be used to provide the number of leads required.  
3. Initial conditioning should be a 15” bend inward one cycle.  
4. Limits and conditions are per the electrical/optical characteristics.  
5. Burn-in for the over range shall use Condition B at a nominal I = 8 mA with “+1” illuminated for t=340 hours.  
F
6. Solderability samples shall not be used.  
7. Visual requirements shall be as specified in MIL-PRF-883, Methods 1010 or 1011.  
8. Displays may be selected prior to seal.  
9. If a given inspection lot, undergoing Group B inspection, has been selected to satisfy the Group C inspection requirements, the 340 hour life tests may  
be continued on test to 1000 hours in order to satisfy the Group C Life Test requirements. In such cases, either the 340 hour endpoint measurements  
shall be made a basis for Group B lot acceptance or the 1000 hour endpoint measurement shall be used as the basis for both Group B and Group C  
acceptance.  
10. MIL-PRF-883 test method applies.  
MICROPAC INDUSTRIES, INC. OPTOELECTRONIC PRODUCTS DIVISION 725 E. Walnut St., Garland, TX 75040 (972) 272-3571 Fax (972) 487-6918  
www.micropac.com E-MAIL: optosales@micropac.com  
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