DS1045
DELAY VS. PROGRAMMED VALUE Table 2
PART NUMBER
DS1045-3
OUTPUT DELAY VALUE
9 12 15 18 21 24 27 30 33 36 39 42 45 48 51 54
DS1045-4
DS1045-5
9 13 17 21 25 29 33 37 41 45 49 53 57 61 65 69
9 14 19 24 29 34 39 44 49 54 59 64 69 74 79 84
PROGRAM VALUES FOR EACH DELAY VALUE
A0 OR B0
A1 OR B1
A2 OR B2
A3 OR B3
0
0
0
0
1
0
0
0
0
1
0
0
1
1
0
0
0
0
1
0
1
0
1
0
0
1
1
0
1
1
1
0
0
0
0
1
1
0
0
1
0
1
0
1
1
1
0
1
0
0
1
1
1
0
1
1
0
1
1
1
1
1
1
1
DS1045 TEST CIRCUIT Figure 2
TEST SETUP DESCRIPTION
Figure 2 illustrates the hardware configuration used for measuring the timing parameters of the DS1045.
The input waveform is produced by a precision pulse generator under software control. Time delays are
measured by a time interval counter (20 ps resolution) connected to the output. The DS1045 parallel
inputs are controlled by an interface to a central computer. All measurements are fully automated with
each instrument controlled by the computer over an IEEE 488 bus.
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DALLAS [ DALLAS SEMICONDUCTOR ]
