DS1013
TEST SETUP DESCRIPTION
Figure 3 illustrates the hardware configuration used for measuring the timing parameters on the DS1013.
The input waveform is produced by a precision pulse generator under software control. Time delays are
measured by a time interval counter (20 ps resolution) connected between each input and corresponding
output. Each output is selected and connected to the counter by a VHF switch control unit. All
measurements are fully automated, with each instrument controlled by a central computer over an IEEE
488 bus.
TEST CONDITIONS
INPUT:
Ambient Temperature:
Supply Voltage (V
CC
):
Input Pulse:
Source Impedance:
Rise and Fall Time:
Pulse Width:
Period:
25°C ± 3°C
5.0V ± 0.1V
High = 3.0V ± 0.1V
Low = 0.0V ± 0.1V
50 ohms Max.
3.0 ns Max.
500 ns
1 µs
OUTPUT:
Each output is loaded with the equivalent of one 74F04 input gate. Delay is measured at the 1.5V level on
the rising and falling edge.
NOTE:
Above conditions are for test only and do not restrict the operation of the device under other data sheet
conditions.
6 of 6
DALLAS [ DALLAS SEMICONDUCTOR ]
