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DS1000-250-IND 参数 Datasheet PDF下载

DS1000-250-IND图片预览
型号: DS1000-250-IND
PDF下载: 下载PDF文件 查看货源
内容描述: [暂无描述]
分类和应用: 延迟线逻辑集成电路光电二极管输出元件
文件页数/大小: 5 页 / 68 K
品牌: DALLAS [ DALLAS SEMICONDUCTOR ]
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DS1000  
TEST CONDITIONS  
INPUT:  
Ambient Temperature:  
Supply Voltage (VCC):  
Input Pulse:  
25°C ±=3°C  
5.0V ±=0.1V  
High = 3.0V ±=0.1V  
Low = 0.0V ±=0.1V  
50 ohm Max.  
3.0 ns Max. (measured between 0.6V and 2.4V)  
500 ns (1 µs for -500)  
1 µs (2 µs for -500)  
Source Impedance:  
Rise and Fall Time:  
Pulse Width:  
Period:  
OUTPUT:  
Each output is loaded with the equivalent of one 74F04 input gate. Delay is measured at the 1.5V level on  
the rising and falling edge.  
NOTE:  
Above conditions are for test only and do not restrict the operation of the device under other data sheet  
conditions.  
5 of 5  
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