ES51925
3000 Counts Smart DMM
Electrical Characteristics
TA=25℃, V- = -3V
Parameter
Power supply
Operating supply current
In Scan AC/DC mode
Symbol
V-
IDD Normal operation
ISS In sleep mode
REV 10MΩ input resistor
Test Condition
Min.
-3.5
—
Typ.
-3.0
2.5
0.6
—
Max
-2.5
—
Units
V
mA
2.5
µA
—
Voltage roll-over error
±0.1 %F.S1
—
Best case straight
—
—
Voltage nonlinearity
NLV
line
±0.1
%F.S
Input Leakage
-10
-2.4
-000
1
-2.3
000
10
-2.2
+000 counts
PA
V
Low battery flag voltage
Zero input reading
Peak to peak backplane
drive voltage
V- to AGND
10MΩ input resistor
-3.5V≤ V ≤-2.2V
3.0
3.15
1
3.3
V
Counter time base period
fOSC = 4MHZ
—
—
sec
Reference voltage and open circuit
voltage for 300Ω measurement
100KΩ resistor
VREF between VRH and
AGND
-1.33
-0.86
-1.23
-0.78
-1.13
-0.70
V
V
Open circuit voltage for Ω
measurement (except 300Ω)
Ω and Continuity
Mode
Between V- pin and
HOLD, RANGE,
SEL,FC1-3,FUA,
FA, VON, AON,
CLAMP, BKLIT
Internal pull-high to 0V
current
—
—
1.2
µA
HZ
AC frequency response at 6.000V
Range
±1%
±5%
40-400
400-2000
—
—
—
10
—
—
AC input response for scan mode
50000
Hz
AC/DC voltage scan mode
sensitivity@1kHz
AC/DC current scan mode
sensitivity@1kHz
VR1(10MΩ input
impedance)
ADP, IVSL and IVSH
300
8
450
10
600
12
mV
mV
pF
Parasitic capacitance
allowed in 3.000MΩ
range
—
—
RDC scan mode RES sensitivity
200
RDC scan mode DIODE sensitivity
RDC scan mode CAP sensitivity
Forward voltage
—
—
—
0.8
—
V
pF
400
Reference voltage temperature
coefficient
100KΩ resister
Between VRH
—
—
ppm/℃
TCRF
50
0℃<TA<70℃
—
—
—
-1.5
-5
-2.0
1.5
5
2.0
%F.S
counts
%F.S
3nF – 3.0µF
Capacitance measurement
accuracy
30µF ~ 30mF
—
-5
5
counts
Note:
1.Full Scale
Ver 2.9
5
10/06/25
CYRUSTEK [ Cyrustek corporation ]
