CY7C291A
CY7C292A/CY7C293A
Electrical Characteristics
Over the Operating Range
[3,4]
7C291A-20
7C292A-20
7C293A-20
Parameter
V
OH
V
OL
V
IH
V
IL
I
IX
V
CD
I
OZ
I
OS
I
CC
Description
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input Load Current
Input Diode Clamp Voltage
Output Leakage Current
Output Short Circuit
Current
[5]
V
CC
Operating Supply
Current
Standby Supply Current
(7C293A Only)
Programming Supply Voltage
Programming Supply Current
Input HIGH Programming
Voltage
Input LOW Programming
Voltage
3.0
0.4
GND < V
OUT
< V
CC
,
Output Disabled
V
CC
= Max., V
OUT
= GND
V
CC
= Max.,
I
OUT
= 0 mA
V
CC
= Max.,
CS
1
= V
IH
Com’l
Mil
Com’l
Mil
12
13
50
3.0
0.4
12
40
−10
−20
+10
−90
120
−10
−20
Test Conditions
V
CC
= Min., I
OH
=
−4.0
mA
V
CC
= Min., I
OL
= 16.0 mA
Guaranteed Input Logical
HIGH Voltage for All Inputs
Guaranteed Input Logical
LOW Voltage for All Inputs
GND < V
IN
< V
CC
−10
2.0
Min.
2.4
0.4
V
CC
0.8
+10
−10
2.0
Max.
7C291A-25
7C292A-25
7C293A-25
Min.
2.4
0.4
V
CC
0.8
+10
Note 4
+10
−90
90
120
30
40
13
50
3.0
0.4
12
13
50
V
mA
V
V
30
mA
−10
−20
+10
−90
60
µA
mA
mA
−10
2.0
Max.
7C291AL-25
7C292AL-25
7C293AL-25
Min.
2.4
0.4
V
CC
0.8
+10
Max.
Unit
V
V
V
V
µA
I
SB
V
PP
I
PP
V
IHP
V
ILP
Notes:
3. See the last page of this specification for Group A subgroup testing information.
4. See the “Introduction to CMOS PROMs” section of the Cypress Data Book for general information on testing.
5. For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.
3
CYPRESS [ CYPRESS SEMICONDUCTOR ]
