CY7C261
CY7C263/CY7C264
Electrical Characteristics
Over the Operating Range
[3,4]
7C261-20, 25
7C263-20, 25
7C264-20, 25
Parameter
V
OH
V
OH
V
OL
V
OL
V
IH
V
IL
I
IX
V
CD
I
OZ
I
OS
I
CC
I
SB
V
PP
I
PP
V
IHP
V
ILP
Description
Output HIGH Voltage
Output HIGH Voltage
Output LOW Voltage
Output LOW Voltage
Input HIGH Level
Input LOW Level
Input Current
Input Diode Clamp Voltage
Output Leakage Current
Output Short Circuit Current
[5]
Power Supply Current
Standby Supply Current (7C261)
Programming Supply Voltage
Programming Supply Current
Input HIGH Programming Voltage
Input LOW Programming Voltage
4.75
0.4
GND < V
OUT
< V
CC
Output Disabled
Com’l
Mil
Com’l
Mil
Com’l
Mil
12
GND < V
IN
< V
CC
–10
–10
–40
–20
Test Conditions
V
CC
= Min., I
OH
= –2.0 mA
V
CC
= Min., I
OH
= –4.0 mA
V
CC
= Min., I
OL
= 8 mA
(6 mA Mil)
V
CC
= Min., I
OL
= 16 mA
2.0
0.8
+10
+10
+40
–90
120
140
40
40
13
50
4.75
0.4
12
–10
Note 4
–10
–40
–20
+10
+40
–90
100
120
30
30
13
50
V
mA
V
V
mA
µA
µA
mA
mA
Note 4
2.0
0.8
+10
0.4
0.4
Min.
2.4
2.4
Max.
7C261-35, 45, 55
7C263-35, 45, 55
7C264-35, 45, 55
Min.
Max.
Unit
V
V
V
V
V
V
µA
V
CC
= Max., V
OUT
= GND
V
CC
= Max., f = Max.
I
OUT
= 0 mA
V
CC
= Max.,
CS > V
IH
Capacitance
[4]
Parameter
C
IN
C
OUT
Description
Input Capacitance
Output Capacitance
Test Conditions
T
A
= 25°C, f = 1 MHz,
V
CC
= 5.0V
Max.
10
10
Unit
pF
pF
Notes:
3. See the last page of this specification for Group A subgroup testing information.
4. See the “Introduction to CMOS PROMs” section of the Cypress Data Book for general information on testing.
5. For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.]
Document #: 38-04010 Rev. *B
Page 3 of 14
CYPRESS [ CYPRESS SEMICONDUCTOR ]
