CY7C1351
[11, 12, 13]
Switching Characteristics Over the Operating Range
–66
–50
–40
Max.
Parameter
Description
Min.
Max.
Min.
20.0
6.0
Max.
Min.
25.0
7.0
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
Clock Cycle Time
Clock HIGH
15.0
5.0
5.0
2.0
0.5
CYC
CH
Clock LOW
6.0
7.0
CL
Address Set-Up Before CLK Rise
Address Hold After CLK Rise
Data Output Valid After CLK Rise
Data Output Hold After CLK Rise
CEN Set-Up Before CLK Rise
CEN Hold After CLK Rise
2.0
2.5
AS
1.0
1.0
AH
11.0
12.0
14.0
CDV
DOH
CENS
CENH
WES
WEH
ALS
ALH
DS
1.5
2.0
0.5
2.0
0.5
2.0
0.5
1.7
0.5
2.0
0.5
1.5
2.0
1.0
2.0
1.0
2.0
1.0
2.0
1.0
2.0
1.0
1.5
2.5
1.0
2.5
1.0
2.5
1.0
2.5
1.0
2.5
1.0
WE, BWS
WE, BWS
Set-Up Before CLK Rise
Hold After CLK Rise
[3:0]
[3:0]
ADV/LD Set-Up Before CLK Rise
ADV/LD Hold after CLK Rise
Data Input Set-Up Before CLK Rise
Data Input Hold After CLK Rise
Chip Select Set-Up
DH
CES
CEH
CHZ
CLZ
EOHZ
EOLZ
EOV
Chip Select Hold After CLK Rise
[10, 12, 13, 14]
Clock to High-Z
5.0
6.0
6.0
5.0
7.0
7.0
5.0
8.0
8.0
[10, 12, 13, 14]
Clock to Low-Z
3.0
0
3.0
0
3.0
0
[10, 12, 13, 14]
OE HIGH to Output High-Z
[10, 12, 13, 14]
OE LOW to Output Low-Z
[12]
OE LOW to Output Valid
Notes:
11. Unless otherwise noted, test conditions assume signal transition time of 2 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output
loading shown in (a) of AC Test Loads.
12.
tCHZ, tCLZ, tEOV, tEOLZ, and tEOHZ are specified with A/C test conditions shown in part (a) of AC Test Loads. Transition is measured ± 200 mV from steady-state
voltage.
13. At any given voltage and temperature, tEOHZ is less than tEOLZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same
data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed
to achieve High-Z prior to Low-Z under the same system conditions.
14. This parameter is sampled and not 100% tested.
9