CY7C261
CY7C263/CY7C264
Electrical Characteristics Over the Operating Range[3,4]
7C261-20, 25
7C263-20, 25
7C264-20, 25
7C261-35, 45, 55
7C263-35, 45, 55
7C264-35, 45, 55
Parameter
VOH
Description
Output HIGH Voltage
Output HIGH Voltage
Output LOW Voltage
Test Conditions
VCC = Min., IOH = –2.0 mA
VCC = Min., IOH = –4.0 mA
Min.
Max.
Min.
Max.
Unit
V
2.4
VOH
2.4
V
VOL
VCC = Min., IOL = 8 mA
(6 mA Mil)
0.4
V
VOL
VIH
VIL
Output LOW Voltage
Input HIGH Level
VCC = Min., IOL = 16 mA
GND < VIN < VCC
0.4
V
V
2.0
2.0
Input LOW Level
0.8
0.8
V
IIX
Input Current
–10
+10
–10
+10
µA
VCD
IOZ
Input Diode Clamp Voltage
Output Leakage Current
Note 4
Note 4
GND < VOUT < VCC
Output Disabled
Com’l
Mil
–10
–40
–20
+10
+40
–90
120
140
40
–10
–40
–20
+10
+40
–90
100
120
30
µA
µA
IOS
ICC
Output Short Circuit Current[5]
Power Supply Current
VCC = Max., VOUT = GND
VCC = Max., f = Max. Com’l
OUT = 0 mA
mA
mA
I
Mil
ISB
Standby Supply Current (7C261) VCC = Max.,
CS > VIH
Com’l
Mil
mA
40
30
VPP
IPP
Programming Supply Voltage
Programming Supply Current
Input HIGH Programming Voltage
Input LOW Programming Voltage
12
13
12
13
V
mA
V
50
50
VIHP
VILP
4.75
4.75
0.4
0.4
V
Capacitance[4]
Parameter
Description
Input Capacitance
Output Capacitance
Test Conditions
TA = 25°C, f = 1 MHz,
VCC = 5.0V
Max.
Unit
CIN
10
10
pF
pF
COUT
Notes:
3. See the last page of this specification for Group A subgroup testing information.
4. See the “Introduction to CMOS PROMs” section of the Cypress Data Book for general information on testing.
5. For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.]
Document #: 38-04010 Rev. *B
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