Test Circuit Schematic
C4D20120A
20A, 1200V
SiC Schottky
D1
L=80 uH
VDC
CDC=42.3 uF
D.U.T
C2M0040120D
Q1
Figure 30. Clamped Inductive Switching
Waveform Test Circuit
Q1
VGS= - 5V
L=80
uH
D.U.T
C2M0040120D
CDC=42.3
uF
VDC
Q2
C2M0040120D
Figure 31. Body Diode Recovery Test Circuit
ESD Ratings
ESD Test
Total Devices Sampled
Resulting Classification
ESD-HBM
ESD-MM
ESD-CDM
All Devices Passed 1000V
All Devices Passed 400V
All Devices Passed 1000V
2ꢀ(>2000V)
Cꢀ(>400V)
IVꢀ(>1000V)
8
C2M0040120D Rev. B, 10-2015