Crane Aerospace & Electronics Power Solutions
STF28-461 EMI Input Filters
28 VOlT INPuT – 0.8 aMP
C
lass
H
and
K, MIl-PRF-38534 E
lEMEnt
E
valuatIon
s
PaCE
t
Est
P
ERFoRMEd
(
CoMPonEnt lEvEl
)
Element Electrical
Element Visual
Internal Visual
Temperature Cycling
Constant Acceleration
Interim Electrical
Burn-in
Post Burn-in Electrical
Steady State Life
Voltage Conditioning Aging
Visual Inspection
Final Electrical
Wire Bond Evaluation
4
SEM
SLAM™/C-SAM:
Input capacitors only
(Add’l test, not req. by H or K)
P
RototyPE
o
non
-QMl
1
M/s
2
P
3
yes
no
no
no
no
no
no
no
no
N/A
no
no
no
no
no
no
no
N/A
no
no
N/A
N/A
N/A
N/A
no
no
no
no
N/A
no
C
lass
H
QMl
M/s
2
P
3
yes
yes
yes
no
no
no
no
no
no
N/A
N/A
yes
yes
no
no
yes
yes
N/A
no
no
N/A
N/A
N/A
N/A
no
no
yes
yes
N/A
yes
C
lass
K
QMl
M/s
2
P
3
yes
yes
yes
yes
yes
yes
yes
yes
yes
N/A
N/A
yes
yes
yes
no
yes
yes
N/A
yes
yes
N/A
N/A
N/A
N/A
yes
yes
yes
yes
N/A
yes
Notes:
1. Non-QML products do not meet all of the requirements of MIL-PRF-38534.
2. M/S = Active components (Microcircuit and Semiconductor Die)
3. P = Passive components
4. Not applicable to EMI filters that have no wirebonds.
Definitions:
Element Evaluation: Component testing/screening per MIL-STD-883 as determined by MIL-PRF-38534
SEM: Scanning Electron Microscopy
SLAM™: Scanning Laser Acoustic Microscopy
C-SAM: C - Mode Scanning Acoustic Microscopy
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