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SMRT283.312TKP 参数 Datasheet PDF下载

SMRT283.312TKP图片预览
型号: SMRT283.312TKP
PDF下载: 下载PDF文件 查看货源
内容描述: SMRT单,双和三DC / DC转换器 [SMRT Single, Dual and Triple DC/DC Converters]
分类和应用: 转换器
文件页数/大小: 17 页 / 243 K
品牌: CRANE [ Crane Aerospace & Electronics. ]
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Crane Aerospace & Electronics Power Solutions  
SMRT Single, Dual and Triple DC/DC Converters  
28 VOLT INPUT – 35 WATT  
C
LASS  
H
AND K, MIL-PRF-38534 ELEMENT  
EVALUATION  
COMPONENT-LEVEL TEST  
PERFORMED  
SPACE PROTOTYPE (O)  
CLASS H  
QML  
CLASS K  
QML  
1
NON-QML  
2
3
2
3
2
3
M/S  
P
M/S  
P
M/S  
P
Element Electrical  
Element Visual  
yes  
no  
no  
no  
yes  
yes  
yes  
yes  
yes  
yes  
yes  
yes  
Internal Visual  
no  
no  
no  
no  
no  
no  
no  
N/A  
no  
no  
no  
no  
no  
N/A  
no  
yes  
no  
N/A  
no  
yes  
yes  
yes  
yes  
yes  
yes  
yes  
N/A  
N/A  
yes  
yes  
yes  
no  
N/A  
yes  
yes  
N/A  
N/A  
N/A  
N/A  
yes  
yes  
yes  
yes  
N/A  
yes  
Temperature Cycling  
Constant Acceleration  
Interim Electrical  
Burn-in  
no  
no  
no  
N/A  
N/A  
N/A  
N/A  
no  
no  
N/A  
N/A  
N/A  
N/A  
no  
no  
Post Burn-in Electrical  
Steady State Life  
Voltage Conditioning Aging  
Visual Inspection  
Final Electrical  
no  
no  
N/A  
N/A  
yes  
yes  
no  
no  
no  
no  
yes  
yes  
N/A  
yes  
4
Wire Bond Evaluation  
no  
SEM  
N/A  
no  
SLAM™/C-SAM:  
no  
Input capacitors only  
(Add’l test, not req. by H or K)  
Notes:  
1. Non-QML products do not meet all of the requirements of MIL-PRF-38534.  
2. M/S = Active components (Microcircuit and Semiconductor Die)  
3. P = Passive components  
4. Not applicable to EMI filters that have no wirebonds.  
Definitions:  
Element Evaluation: Component testing/screening per MIL-STD-883 as determined by MIL-PRF-38534  
SEM: Scanning Electron Microscopy  
SLAM™: Scanning Laser Acoustic Microscopy  
C-SAM: C - Mode Scanning Acoustic Microscopy  
www.craneae.com  
Page 15 of 17  
Rev B – 20080213  
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