Crane Aerospace & Electronics Power Solutions
sMFL sꢀꢁglꢂ ꢃꢁꢄ dꢅꢃl dc/dc cꢆꢁvꢂꢇꢈꢂꢇꢉ
28 VoLt input – 65 Watt
Class H and K, QMl sCreening: eleMent evaluation
eleMent evaluation
spaCe
prototype o
Class H
Class K
1
test perforMed
non-QMl
QMl
2
QMl
2
2
3
3
3
(CoMponent level)
M/s
p
M/s
p
M/s
p
Element Electrical
Element Visual
yes
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
yes
yes
yes
no
yes
yes
no
yes
yes
yes
yes
yes
yes
yes
yes
yes
no
yes
yes
no
Internal Visual
Temperature Cycling
Constant Acceleration
Interim Electrical
Burn-in
no
yes
yes
no
no
no
no
no
no
no
no
Post Burn-in Electrical
Steady State Life
Voltage Conditioning Aging
Visual Inspection
Final Electrical
no
no
no
no
no
no
no
no
yes
yes
yes
yes
no
no
no
no
yes
yes
no
yes
yes
no
yes
yes
yes
4
Wire Bond Evaluation
SEM
SLAM™/C-SAM:
Input capacitors only
(Add’l test, not req. by H or K)
no
no
no
yes
no
yes
Notes:
1. Non-QML products do not meet all of the requirements of MIL-PRF-38534
2. M/S = Active components (Microcircuit and Semiconductor Die)
3. P = Passive components
4. Not applicable to EMI filters that have no wirebonds
Definitions:
Element Evaluation: Component testing/screening per MIL-STD-883 as determined by MIL-PRF-38534
SEM: Scanning Electron Microscopy
SLAM™: Scanning Laser Acoustic Microscopy
C-SAM: C - Mode Scanning Acoustic Microscopy
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