QA SCREENING
SPACE PRODUCTS
S
PACE
P
RODUCTS
E
LEMENT
E
VALUATION
T
EST
P
ERFORMED
(
COMPONENT LEVEL
)
Element Electrical
Element Visual
Internal Visual
Temperature Cycling
Constant Acceleration
Interim Electrical
Burn-in
Post Burn-in Electrical
Steady State Life
Voltage Conditioning /Aging
Visual Inspection
Final Electrical
Wire Bond Evaluation
*
SEM
SLAM™/C-SAM:
Input capacitors only
(Add’l test, not req. by H or K)
Notes
M/S
P
*
S
TANDARD
C
LASS
(O)
H
M/S
P M/S
P
yes
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
no
yes
yes
yes
no
no
no
no
no
no
no
no
yes
yes
no
no
C
LASS
K
M/S
P
yes
yes
no
yes
yes
no
no
no
no
yes
yes
yes
yes
no
yes
yes yes
yes yes
no
no
no
no
no
no
no
no
no
yes
yes
yes
yes
yes
yes
yes
no
no
yes yes
yes yes
no
yes
yes
no
Active components (Microcircuit and Semiconductor Die)
Passive components
Not applicable to EMI filters that have no wirebonds
Definitions
Element Evaluation: Component testing/screening per MIL-STD-883 as determined by MIL-PRF-38534
SEM: Scanning Electron Microscopy
SLAM™: Scanning Laser Acoustic Microscopy
C-SAM: C - Mode Scanning Acoustic Microscopy
Applies to the following products:
SMFLHP Series
SMFL Series
SMHP Series (O&H only)
SMTR Series
SSP Series
SMHF Series
SMSA Series
SLH Series
SLIM Module
SFME120 EMI Filter
SFME28 EMI Filter
SFCS EMI Filter
SFMC EMI Filter
STF EMI Filter
C2-7
CRANE [ Crane Aerospace & Electronics. ]
