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SFCS28-461 参数 Datasheet PDF下载

SFCS28-461图片预览
型号: SFCS28-461
PDF下载: 下载PDF文件 查看货源
内容描述: sFcs28-461 EMI输入滤波器 [SFCS28-461 EMI Input Filters]
分类和应用: LTE
文件页数/大小: 9 页 / 354 K
品牌: CRANE [ Crane Aerospace & Electronics. ]
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Crane Aerospace & Electronics Power Solutions
sFcs28-461 eMi input Filters
28 Volt input – 5 aMp
c
laSS
H
and
k, Mil-prF-38534 e
leMent
e
valuatiOn
t
eSt
p
erFOrMed
(
cOMpOnent
level
)
p
rOtOtype
O
nOn
-QMl
1
M/S
2
p
3
yes
no
no
no
no
no
no
no
no
N/A
no
no
no
no
no
no
no
N/A
no
no
N/A
N/A
N/A
N/A
no
no
no
no
N/A
no
S
pace
c
laSS
H
QMl
M/S
2
p
3
yes
yes
yes
no
no
no
no
no
no
N/A
N/A
yes
yes
no
no
yes
yes
N/A
no
no
N/A
N/A
N/A
N/A
no
no
yes
yes
N/A
yes
c
laSS
k
QMl
M/S
2
p
3
yes
yes
yes
yes
yes
yes
yes
yes
yes
N/A
N/A
yes
yes
yes
no
yes
yes
N/A
yes
yes
N/A
N/A
N/A
N/A
yes
yes
yes
yes
N/A
yes
Element Electrical
Element Visual
Internal Visual
Temperature Cycling
Constant Acceleration
Interim Electrical
Burn-in
Post Burn-in Electrical
Steady State Life
Voltage Conditioning Aging
Visual Inspection
Final Electrical
Wire Bond Evaluation
4
SEM
SLAM™/C-SAM:
Input capacitors only
(Add’l test, not req. by H or K)
Notes:
1. Non-QML products do not meet all of the requirements of MIL-PRF-38534.
2. M/S = Active components (Microcircuit and Semiconductor Die)
3. P = Passive components
4. Not applicable to EMI filters that have no wirebonds.
Definitions:
Element Evaluation: Component testing/screening per MIL-STD-883 as determined by MIL-PRF-38534
SEM: Scanning Electron Microscopy
SLAM™: Scanning Laser Acoustic Microscopy
C-SAM: C - Mode Scanning Acoustic Microscopy
www.craneae.com
Page 7 of 9
Rev B - 20070404