EVER BRIGHT OPTOELECTRONICS CORP.
EC04-1206QRC/E-AV
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Reliability Test
Classification
Test Item
Reference Standard
Test Conditions
Result
Operation Life MIL-STD-750D:1026
MIL-STD-883D:1005
JIS-C-7021
:B-1
High
Temperature MIL-STD-202F:103B
High Humidity JIS-C-7021
:B-11
Endurance
Storage
Test
High
MIL-STD-883:1008
Temperature
JIS-C-7021
:B-10
Storage
Low
Temperature JIS-C-7021
:B-11
Storage
Temperature MIL-STD-202F:107D
Cycling
MIL-STD-750D:1051
MIL-STD-883D:1010
JIS-C-7021
:A-2
Thermal Shock MIL-STD-202F:107D
Environmental
MIL-STD-750D:1051
Test
MIL-STD-883D:1011
Solder
MIL-STD-202:201A
Resistance
MIL-STD-750:2031
JIS-C-7021
:A-1
Connect with a power If=20mA
Ta=Under room temperature
Test time=1,000hrs
Ta=+85℃±5℃
RH=90%-95%
Test time=240hrs
High Ta=+100℃±5℃
Test time=1,000hrs
Low Ta=-40℃±5℃
Test time=1,000hrs
-35℃±5℃~+25℃~+85℃±5℃~+25℃
30min 5min
30min
5min
Test Time=10cycle
-40℃±5℃ ~+85℃±5℃
20min
20min
Test Time=10cycle
Preheating：
140℃-160℃,within 2 minutes.
Operation heating：
260℃(Max.), within 10seconds. (Max.)
0/20
0/20
0/20
0/20
0/20
0/20
0/20
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Judgment criteria of failure for the reliability
Measuring items
Forward voltage
Reverse current
Luminous intensity
Symbol
V
F
( V)
I
R
(uA)
Iv ( mcd )
Measuring conditions
I
F
=20mA
V
R
=5V
I
F
=20mA
Judgement criteria for failure
Initial Level*1.1
Over U*2
Initial Level*0.7
Note:
1.U means the upper limit of specified characteristics.
2.Measurment shall be taken between 2 hours and after the test pieces have been returned to
normal ambient conditions after completion of each test.
ONE THREE SIX ZERO ZERO TWO FIVE NINE SEVEN DOUBLE NINE,MR.CHEN
Ver.1.0 Page 5 of 7
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