Switching Diode
Figure 3. Forward Current De-rating
500
200
CD4148WP
Figure 4. Reverse Voltage De-rating
400
150
300
IF/ mA
.
.
50
0
0
200
100
0
0
20
40
60
80
100 120
140 160 180 200
VR/ V
100
20
40
60
80
100 120
140 160 180 200
Tamb-Ambient Temperature/oC
Tamb-Ambient Temperature/oC
TEST CHARACTERISTICS
Test Item
Solderability
Resistance to Soldering Heat
Humidity Steady State
Continue Forward Operating Life
Thermal Shock
Bending Strength
Test Condition
Sn bath at 245±5
o
C for 2±0.5s
Sn bath at 260±5
o
C for 10±2s
At 85
o
C 85%RH for 168hrs
At 25
o
C I
F
=1.1I
F
for 1000hrs
-55 ±5
o
C/5min to 150±5
o
C/5min
for 10cycles
Bending up to 2mm for 1cycle
Requirement
>95% area tin covered
V
F
,V
R
& I
R
within spec;
no mechanical damage
V
F
,V
R
& I
R
within spec
V
F
,V
R
& I
R
within spec
V
F
,V
R
& I
R
within spec
V
F
,V
R
& I
R
within spec;
no mechanical damage
MDD ELECTRONIC
CHENDA [ Chendahang Electronics Co., Ltd ]
