ELECTRICAL SPECIFICATIONS
T
A
= T
MIN
-T
MAX
, V
DD1
=V
DD2
= 3.3 V, Sampling Rate = 28 MSPS, Differential input signal, 50% duty cycle clock with 2.5 ns rise and fall times, unless otherwise
specified.
PARAMETERS
Dynamic Performance
Spurious Free Dynamic Range (SFDR)
Differential Phase (DP)
Differential Gain (DG)
Digital Inputs
Logic 0 Voltage (V
IL
)
Logic 1 Voltage (V
IH
)
Logic 0 Current (IIL)
Logic 1 Current (I
IH
)
Input Capacitance (C
IND
)
Digital Outputs
Logic 0 Voltage (V
OL
)
Logic 1 Voltage (V
OH
)
Output Hold Time (t
H
)
Output Delay Time (t
D
)
Switching Performance
Maximum Conversion Rate (f
S
)
Minimum Conversion Rate
Pipeline Delay (See Timing Diagram)
Aperture Jitter
σ
AP
Aperture Delay t
AP
Power Supply
Supply Voltage V
DD
Supply Current I
DD
ext ref
int ref
Power Dissipation P
D
ext ref
int ref
Sleep Mode Current
ext ref
int ref
Sleep Mode Power Dissipation
ext ref
int ref
Power Supply Rejection Ratio (PSRR)
TEST
CONDITIONS
f
IN
= 5.0 MHz
f
IN
= 10.0 MHz
TEST
LEVEL
V
VI
V
V
VI
VI
VI
VI
V
VI
VI
V
V
VI
IV
IV
V
V
IV
VI
VI
VI
VI
VI
VI
VI
VI
V
MIN
SPT7936
TYP
67
64
0.08
0.27
MAX
UNITS
dB
dB
degrees
%
62
20% V
DD
80% V
DD
±1
±1
1.8
0.2
90% V
DD
5
8
0.4
µA
µA
pF
V
V
ns
ns
MSPS
MSPS
Clocks
ps
ns
3.6
87
91
288
300
9
12
29
40
V
mA
mA
mW
mW
mA
mA
mW
mW
dB
(V
I
=V
SS
)
(V
I
=V
DD
)
(I = +2 mA)
(I = -2 mA)
85% V
DD
28
1
8.0
10
2
3.0
3.3
75
79
248
260
8
11
25
36
52
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions: All parameters having min/
max specifications are guaranteed. The Test
Level column indicates the specific device test-
ing actually performed during production and
Quality Assurance inspection. Any blank sec-
tion in the data column indicates that the speci-
fication is not tested at the specified condition.
TEST LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
A
= +25
°C,
and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at T
A
= +25
°C.
Parameter is
guaranteed over specified temperature range.
SPT7936
3
8/1/00
CADEKA [ CADEKA MICROCIRCUITS LLC. ]
