ELECTRICAL SPECIFICATIONS
T
A
=T
MIN
to T
MAX
, V
DD
=+5.0 V, ƒ
S
=40 MSPS, V
REFH
=3.0 V, V
REFL
=2.0 V, OV
DD
=3.0 V, unless otherwise specified.
PARAMETERS
Power Supply Requirements
V
DD
Voltage (Analog Supply)
OV
DD
Voltage (Output Supply)
V
DD
Current
OV
DD
Current
Power Dissipation
External Voltage Reference
Internal Voltage Reference
Sleep Mode Power Dissipation
External Voltage Reference
Internal Voltage Reference
Power Supply Rejection Ratio (PSRR)
TEST
CONDITIONS
TEST
LEVEL
IV
IV
VI
VI
VI
VI
VI
VI
V
VI
V
V
VI
VI
IV
IV
VI
VI
VI
VI
VI
VI
VI
VI
VI
VI
MIN
4.75
2.7
SPT7864
TYP
5.0
3.0/5.0
74
8
387
395
45
55
45
MAX
5.25
5.25
UNITS
V
V
mA
mA
mW
mW
mW
mW
dB
V
ppm/°C
kΩ
V
V
V
V
V
V
V
V
µA
µA
V
V
µA
µA
417
425
47
56
Internal References
Common Mode Voltage Reference (V
CM
) IO = –1 µA
Common Mode Voltage Tempco
Output Impedance (V
CM
)
(EXT/INT) = 0
Reference Low Output Voltage (V
REFL
)
Reference High Output Voltage (V
REFH
) (EXT/INT) = 0
External References
Reference Low Input Voltage Range
Reference High Input Voltage Range
Digital Outputs
Output Voltage High
Output Voltage Low
Digital Inputs
Input High Voltage
Input Low Voltage
Input High Current
Input Low Current
Clock Inputs
Clock Inputs High Voltage
Clock Inputs Low Voltage
Clock Inputs High Current
Clock Inputs Low Current
(EXT/INT) = 1
(EXT/INT) = 1
IO = –2 mA
IO = 2 mA
2.4
1.95
2.95
1.7
2.7
85% OV
DD
2.5
100
2
2.0
3.0
2.0
3.0
90% OV
DD
0.2
2.6
2.05
3.05
2.3
3.3
OV
DD
0.4
80% V
DD
20% V
DD
±100
±100
2
5
0.4
±115
±115
TEST LEVEL CODES
TEST LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
A
= +25 °C, and sample tested
at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and
characterization data.
Parameter is a typical value for information purposes only.
100% production tested at T
A
= +25 °C. Parameter is
guaranteed over specified temperature range.
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications are
guaranteed. The Test Level column indicates the
specific device testing actually performed during
production and Quality Assurance inspection. Any
blank section in the data column indicates that the
specification is not tested at the specified
condition.
SPT7864
3
11/20/01
CADEKA [ CADEKA MICROCIRCUITS LLC. ]
