ELECTRICAL SPECIFICATIONS
T
A
=T
MIN
to T
MAX
, AV
DD
=DV
DD
=OV
DD
=+5.0 V, V
IN
=0 to 4 V, ƒ
S
=40 MSPS, V
RHS
=4.0 V, V
RLS
=0.0 V, unless otherwise specified.
PARAMETERS
Dynamic Performance
Total Harmonic Distortion (THD)
ƒ
IN
= 3.58 MHz
ƒ
IN
= 10 MHz
Signal-to-Noise and Distortion
(SINAD)
ƒ
IN
= 3.58 MHz
ƒ
IN
= 10 MHz
Spurious Free Dynamic Range
Differential Phase
Differential Gain
Inputs
Logic 1 Voltage
Logic 0 Voltage
Maximum Input Current Low
Maximum Input Current High
Input Capacitance
Digital Outputs
Logic 1 Voltage
Logic 0 Voltage
t
RISE
t
FALL
Output Enable to Data Output Delay
Power Supply Requirements
Voltages
OV
DD
DV
DD
AV
DD
Currents
AI
DD
DI
DD
Power Dissipation
TEST
CONDITIONS
TEST
LEVEL
MIN
SPT7863
TYP
MAX
UNITS
VI
V
VI
V
V
V
V
VI
VI
VI
VI
VI
I
OH
= 0.5 mA
I
OL
= 1.6 mA
15 pF load
15 pF load
20 pF load, T
A
= +25 °C
50 pF load over temp.
VI
VI
V
V
V
V
IV
IV
IV
VI
VI
VI
64
67
62
57
54
70
±0.3
±0.3
dB
dB
dB
dB
dB
Degree
%
V
V
µA
µA
pF
V
V
ns
ns
ns
ns
V
V
V
mA
mA
mW
54
ƒ
IN
= 3.580 MHz
2.0
–10
–10
+5
3.5
0.4
10
10
10
22
3.0
4.75
4.75
5.0
5.25
5.25
21
21
210
0.8
+10
+10
5.0
5.0
17
16
160
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
A
= +25 °C, and sample tested at the
specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and characteri-
zation data.
Parameter is a typical value for information purposes only.
100% production tested at T
A
= +25 °C. Parameter is guaranteed
over specified temperature range.
SPT7863
3
8/21/01
CADEKA [ CADEKA MICROCIRCUITS LLC. ]
