ELECTRICAL SPECIFICATIONS
T
A
= +25
°C,
V
DD
= +5.0 V, V
IN
= 0 to +3 V, f
CLK
= 35 MHz, f
S
= 2.5 MSPS, V
REF
+ = +3.0 V, V
REF
– = 0.0 V, unless otherwise specified.
PARAMETERS
Dynamic Performance
Effective Number of Bits
f
IN
= 500 kHz
f
IN
= 1 MHz
Signal-to-Noise Ratio
f
IN
= 500 kHz
f
IN
= 1 MHz
Harmonic Distortion
f
IN
= 500 kHz
f
IN
= 1 MHz
Power Supply Requirements
+V
DD
Supply Voltage
+V
DD
Supply Current
Power Dissipation
3
TEST
CONDITIONS
TEST
LEVEL
MIN
TYP
MAX
UNITS
IV
IV
IV
IV
IV
IV
IV
IV
VI
IV
VI
3
8.9
8.5
56
55
63
58
5.5
7
10
22
50
Bits
Bits
dB
dB
dB
dB
V
mA
mA
mW
mW
V
DD
= +3.0 V
V
DD
= +5.0 V
V
DD
= +3.0 V
V
DD
= +5.0 V
5.4
9
16
45
3
Excluding reference ladder.
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
TEST LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
A
=+25
°C,
and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at T
A
= +25
°C.
Parameter is
guaranteed over specified temperature range.
SPT7830
3
12/29/99
CADEKA [ CADEKA MICROCIRCUITS LLC. ]
