ELECTRICAL SPECIFICATIONS
T
A
=+25
°C,
AV
DD
=DV
DD
=+5.0 V, AGND=DGND=0.0 V, V
RB
=+0.6 V and V
RT
=+2.6 V, unless otherwise specified.
PARAMETERS
Dynamic Performance
Signal-To-Noise Ratio
f
IN
=1.0 MHz
f
IN
=3.58 MHz
f
IN
=10 MHz
Spurious Free
Dynamic Range
f
IN
=1.0 MHz
f
IN
=3.58 MHz
f
IN
=10 MHz
Differential Phase
Differential Gain
Digital Inputs
Input Current, Logic High
Input Current, Logic Low
Pulse Width High (CLK)
Pulse Width Low (CLK)
Voltage, Logic High
Voltage, Logic Low
Digital Outputs
Output Current, High
Output Current, Low
Output Current, High Z
Voltage High
Voltage Low
Power Supply Requirements
Analog Supply Voltage (AV
DD
)
Digital Supply Voltage (DV
DD
)
Supply Voltage Difference
Supply Current
Power Dissipation
TEST
CONDITIONS
f
S
= 20 MSPS
I
I
V
f
S
= 20 MSPS
I
I
V
V
V
I
I
IV
IV
I
I
IV
IV
IV
I
I
IV
IV
IV
I
I
TEST
LEVEL
MIN
SPT1175
TYP
MAX
UNITS
44
43
46
45
39
dB
dB
dB
44
41
NTSC 20 IRE Mod Ramp
f
S
= 14.3 MSPS
V
DD
= 5.25 V, V
IH
= V
DD
V
DD
= 5.25 V, V
IL
= DGND
47
44
33
0.7
1.0
1.0
1.0
dB
dB
dB
Degrees
%
µA
µA
ns
ns
V
V
mA
mA
µA
V
V
V
V
V
mA
mW
15
15
4.0
1.0
-1.1
3.5
16
4.0
V
DD
= 4.75 V
V
DD
= 4.75 V
V
DD
= 5.25 V,
OE
= V
DD
0.4
+4.75
+4.75
-0.1
+5.0
+5.0
0.0
18
90
+5.25
+5.25
0.1
27
135
(AV
DD
-DV
DD
)
f
S
=20 MSPS
TEST LEVEL CODES
All electrical characteristics are subject to the following
conditions:
All parameters having min/max specifications are guar-
anteed. The Test Level column indicates the specific
device testing actually performed during production
and Quality Assurance inspection. Any blank section in
the data column indicates that the specification is not
tested at the specified condition.
TEST LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
A
= +25
°C,
and sample tested
at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and
characterization data.
Parameter is a typical value for information purposes only.
100% production tested at T
A
= +25
°C.
Parameter is
guaranteed over specified temperature range.
SPT1175
3
6/24/97
CADEKA [ CADEKA MICROCIRCUITS LLC. ]
