ELECTRICAL SPECIFICATIONS
V
CC
=ground, V
EE
= -5.2 V
±0.3
V, T
A
=T
MIN
to T
MAX
, C
C
= 0 pF, I
Set
= 1.105 mA, unless otherwise specified.
PARAMETERS
Input Capacitance,
Data and Controls
Power Supply Sensitivity
Supply Current
Maximum Conversion Rate
Rise Time
Rise Time
Current Settling Time, Clocked Mode
Current Settling Time, Clocked Mode
Current Settling Time, Clocked Mode
t
SI
Clock to Output Delay, Clocked Mode
t
DSC
Data to Output Delay,
Transparent Mode t
DST
Convert Pulse Width, ( Low or High)
t
PWL
, t
PWH
Glitch Energy
Reference Bandwidth, -3 dB
Set-up Time, Data and Controls
t
S
Hold Time, Data and Controls
t
H
Slew Rate
Clock Feedthrough
TEST
CONDITIONS
LEVEL
V
VI
VI
MIN
TYP
3.0
MAX
UNITS
pF
DC ELECTRICAL CHARACTERISTICS
-120
20
155
+120
220
µA/V
mA
MWPS
MWPS
ns
ns
ns
ns
ns
ns
DYNAMIC CHARACTERISTICS (
R
L
= 37.5 ohms, C
L
= 5 pF, T
A
= 25
°C,
I
Set
= 1.105 mA)
B Grade
A Grade
10% to 90% G.S.
T
A
= T
MIN
to T
MAX
10% to 90% G.S.
R
L
= 25 ohms
To 0.2% G.S.
To 0.8% G.S.
To 0.2% G.S.
R
L
= 25
Ω
T
A
= T
MIN
to T
MAX
T
A
= T
MIN
to T
MAX
B Grade
A Grade
Area = 1/2 VT
IV
IV
IV
IV
V
V
V
V
IV
IV
IV
IV
IV
IV
V
V
IV
IV
IV
IV
IV
IV
IV
IV
165
275
1.6
2.0
1.0
7.0
5.5
4.5
2.2
3.2
3.0
1.8
4
1.0
1.0
1.0
0.5
0.5
390
325
-48
-48
4.0
4.5
6.0
6.0
T
A
= T
MIN
to T
MAX
T
A
= T
MIN
to T
MAX
20% to 80% G.S.
T
A
= T
MIN
to T
MAX
T
A
= T
MIN
to T
MAX
ns
ns
ns
ns
ns
ns
pV-s
MHz
ns
ns
ns
ns
V/µS
V/µS
dB
dB
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions: All parameters having min/
max specifications are guaranteed. The Test
Level column indicates the specific device test-
ing actually performed during production and
Quality Assurance inspection. Any blank sec-
tion in the data column indicates that the speci-
fication is not tested at the specified condition.
TEST LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
A
= +25
°C,
and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at T
A
= +25
°C.
Parameter is
guaranteed over specified temperature range.
SPT1018
3
5/14/97
CADEKA [ CADEKA MICROCIRCUITS LLC. ]
