ELECTRICAL SPECIFICATIONS
V
=ground, V = -5.2 V ±0.3 V, T =T
to T
, C = 0 pF, I
C
= 1.105 mA, unless otherwise specified.
Set
CC
EE
A
MIN
MAX
TEST
CONDITIONS
PARAMETERS
LEVEL
MIN
TYP
MAX
UNITS
DC ELECTRICAL CHARACTERISTICS
Input Capacitance,
V
3.0
pF
Data and Controls
Power Supply Sensitivity
Supply Current
VI
VI
-120
20
+120
220
µA/V
155
mA
DYNAMIC CHARACTERISTICS (R = 37.5 ohms, C = 5 pF, T = 25 °C, I = 1.105 mA)
L
L
A
Set
Maximum Conversion Rate
B Grade
IV
IV
IV
IV
V
165
MWPS
MWPS
ns
A Grade
275
Rise Time
10% to 90% G.S.
T = T to T
MAX
1.6
2.0
ns
A
MIN
Rise Time
10% to 90% G.S.
1.0
ns
R = 25 ohms
L
Current Settling Time, Clocked Mode
Current Settling Time, Clocked Mode
Current Settling Time, Clocked Mode
To 0.2% G.S.
To 0.8% G.S.
To 0.2% G.S.
V
V
V
7.0
5.5
4.5
ns
ns
ns
t
SI
R = 25 Ω
L
Clock to Output Delay, Clocked Mode
IV
IV
IV
IV
IV
IV
V
2.2
3.2
4.0
4.5
6.0
6.0
ns
t
T = T
to T
to T
ns
DSC
A
MIN
MAX
Data to Output Delay,
Transparent Mode t
ns
T = T
A
ns
DST
MIN
MAX
Convert Pulse Width, ( Low or High)
, t
B Grade
A Grade
3.0
1.8
ns
t
ns
PWL PWH
Glitch Energy
Area = 1/2 VT
4
pV-s
MHz
ns
Reference Bandwidth, -3 dB
Set-up Time, Data and Controls
V
1.0
IV
IV
IV
IV
IV
IV
IV
IV
1.0
1.0
t
S
T = T
A
to T
to T
ns
MIN
MIN
MAX
Hold Time, Data and Controls
0.5
ns
t
H
T = T
A
0.5
ns
MAX
Slew Rate
20% to 80% G.S.
390
325
V/µS
V/µS
dB
dB
T = T
A
to T
MIN
MIN
MAX
MAX
Clock Feedthrough
-48
-48
T = T
A
to T
TEST LEVEL CODES
TEST LEVEL
TEST PROCEDURE
All electrical characteristics are subject to the
following conditions: All parameters having min/
max specifications are guaranteed. The Test
Level column indicates the specific device test-
ing actually performed during production and
Quality Assurance inspection. Any blank sec-
tion in the data column indicates that the speci-
fication is not tested at the specified condition.
I
100% production tested at the specified temperature.
II
100% production tested at T = +25 °C, and sample
A
tested at the specified temperatures.
III
QA sample tested only at the specified temperatures.
IV
Parameter is guaranteed (but not tested) by design
and characterization data.
V
Parameter is a typical value for information purposes
only.
VI
100% production tested at T = +25 °C. Parameter is
A
guaranteed over specified temperature range.
SPT1018
5/14/97
3
CADEKA [ CADEKA MICROCIRCUITS LLC. ]
