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2FAH-C20R 参数 Datasheet PDF下载

2FAH-C20R图片预览
型号: 2FAH-C20R
PDF下载: 下载PDF文件 查看货源
内容描述: 集成无源及使用CSP有源器件 [Integrated Passive & Active Device using CSP]
分类和应用: 数据线路滤波器过滤器LTE
文件页数/大小: 4 页 / 223 K
品牌: BOURNS [ BOURNS ELECTRONIC SOLUTIONS ]
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VE S CO
AV R M
AI SIO PL
LA N IA
BL S NT
E
Features
Lead free versions available
RoHS compliant (lead free version)*
New Product Development
Integrated Passive Device
ESD Protection to IEC61000-4-2 Spec.
*R
2FAH-C20R Series - Integrated Passive & Active Device using CSP
General Information
This application specific integrated passive component is
designed to provide all of the necessary ESD protection
and line resistance required on the data port of a custom
portable electronic device. The ESD protection provided by
the component enables the data port to withstand ±8 KV
Contact / ±15 KV Air Discharge when tested according to
the method specified in IEC 61000-4-2. The component
incorporates 7 identical channels and is supplied in a 20
pin CSP package which is intended to be mounted
directly onto an FR4 printed circuit board. This package
will meet typical thermal cycle and bend test specifica-
tions without the use of an underfill material.
SOLDER
BUMPS
SILICON
DIE
Figure 1 – CSP Format
Electrical & Thermal Characteristics
Electrical Characteristics
(T
A
= 25 °C unless otherwise noted)
Zener Diode
Breakdown Voltage @ 1 mA
Leakage Current @ 3 V
ESD Performance (Note 1)
Withstand
Contact Discharge
Air Discharge
Let Through (Note 2)
Contact Discharge
Air Discharge
Channel Specification
Resistance
Capacitance @ 1 V & 1 MHz
Symbol
V
BR
I
R
Minimum
6
Nominal
7.2
Maximum
8
1
Unit
V
µA
±8
±15
±150
±150
R
C
90
8.5
100
10.5
110
12.5
kV
kV
V
V
pF
Thermal Characteristics
(T
A
= 25 °C unless otherwise noted)
Operating Temperature
Storage Temperature
Total Power Dissipation @ 70 °C
Note:
T
J
T
stg
P
D
-40
-60
25
25
+85
+125
100
°C
°C
mW
1. The IEC 61000-4-2 test method will be adapted for component level testing. The device will provide the specified ESD protection
performance on the “IN 1-7” pins only.
2. “Let Through” is a measure of the component of an incident ESD transient that the protection device allows through to the down
stream circuitry.
*RoHS Directive 2002/95/EC Jan 27 2003 including Annex
Specifications are subject to change without notice.
Customers should verify actual device performance in their specific applications.