PCM3793A
PCM3794A
www.ti.com
SLAS529A–JANUARY 2007–REVISED FEBRUARY 2007
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)(1)
MAX
–0.3 to 4
±0.1
UNIT
V
Supply voltage
VDD, VIO, VCC, VPA
Ground voltage differences: DGND, AGND, PGND
Input voltage
V
–0.3 to 4
±10
V
Input current (any pins except supplies and SPK out)
Ambient temperature under bias
Storage temperature
mA
°C
–40 to 110
–55 to 150
150
°C
Junction temperature
°C
Lead temperature (soldering)
Package temperature (reflow, peak)
260
°C, 5 s
°C
260
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
over operating free-air temperature range (unless otherwise noted)
MIN
2.4
NOM
3.3
MAX UNIT
VCC, VPA
VDD, VIO
Analog supply voltage
Digital supply voltage
Digital input logic family
3.6
3.6
V
V
1.71
3.3
CMOS
SCKI system clock
3.072
8
18.432
48
MHz
kHz
kΩ
Ω
Digital input clock frequency
LRCK sampling clock
LOL and LOR
10
16
8
Analog output load resistance
HPOL and HPOR
SPOLP, SPOLN, SPORP and SPORN
Ω
Analog output load capacitance
Digital output load capacitance
Operating free-air temperature
30
10
85
pF
pF
°C
TA
–40
2
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