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SBOS051B − OCTOBER 1995 − REVISED FEBRUARY 2005
ABSOLUTE MAXIMUM RATINGS(1)
ELECTROSTATIC DISCHARGE SENSITIVITY
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18V
Analog Input Voltage Range . . . . . . . . . . . . . . . . . . . . . . . . . . . 40V
Output Short-Circuit (to ground) . . . . . . . . . . . . . . . . . . Continuous
This integrated circuit can be damaged by
ESD. Texas Instruments recommends that all
integrated circuits be handled with appropriate
precautions. Failure to observe proper handling and
installation procedures can cause damage.
Operating Temperature
. . . . . . . . . . . . . . . . . . . −40°C to +125°C
Storage Temperature Range . . . . . . . . . . . . . . . . . −55°C to +125°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +150°C
Lead Temperature (soldering, 10s) . . . . . . . . . . . . . . . . . . . . . +300°C
ESD damage can range from subtle performance
degradation to complete device failure. Precision
integrated circuits may be more susceptible to damage
because very small parametric changes could cause the
device not to meet its published specifications.
(1)
Stresses above these ratings may cause permanent damage.
Exposure to absolute maximum conditions for extended periods
may degrade device reliability. These are stress ratings only, and
functional operation of the device at these or any other conditions
beyond those specified is not implied.
ORDERING INFORMATION
For the most current package and ordering information, see the Package Option Addendum located at the end of this data
sheet.
PIN CONFIGURATION
8-Pin DIP and SO-8
Top View
1
2
3
4
8
7
6
5
RG
RG
V+
VO
Ref
V−
IN
IN
V+
V−
2
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