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BUF634U-2K5E4 参数 Datasheet PDF下载

BUF634U-2K5E4图片预览
型号: BUF634U-2K5E4
PDF下载: 下载PDF文件 查看货源
内容描述: 250mA高速缓冲器 [250mA HIGH-SPEED BUFFER]
分类和应用:
文件页数/大小: 20 页 / 851 K
品牌: BB [ BURR-BROWN CORPORATION ]
 浏览型号BUF634U-2K5E4的Datasheet PDF文件第1页浏览型号BUF634U-2K5E4的Datasheet PDF文件第2页浏览型号BUF634U-2K5E4的Datasheet PDF文件第4页浏览型号BUF634U-2K5E4的Datasheet PDF文件第5页浏览型号BUF634U-2K5E4的Datasheet PDF文件第6页浏览型号BUF634U-2K5E4的Datasheet PDF文件第7页浏览型号BUF634U-2K5E4的Datasheet PDF文件第8页浏览型号BUF634U-2K5E4的Datasheet PDF文件第9页  
PIN CONFIGURATION  
Top View  
8-Pin Dip Package  
Top View  
SO-8 Surface-Mount Package  
5-Lead  
TO-220  
BW  
NC  
VIN  
V–  
1
2
3
4
8
7
6
5
NC  
V+  
VO  
NC  
5-Lead DDPAK  
Surface Mount  
G = 1  
G = 1  
G = 1  
1
2
3
4
1 2 3 4  
5
5
NC = No Connection  
BW  
VIN  
V–  
V+  
VO  
ABSOLUTE MAXIMUM RATINGS  
Supply Voltage ..................................................................................... ±18V  
Input Voltage Range ............................................................................... ±VS  
Output Short-Circuit (to ground) .................................................Continuous  
Operating Temperature ..................................................... –40°C to +125°C  
Storage Temperature ........................................................ –55°C to +125°C  
Junction Temperature ....................................................................... +150°C  
Lead Temperature (soldering,10s).................................................... +300°C  
BW  
VIN  
V–  
V+  
NOTE: Tab electrically  
connected to V–.  
VO  
ELECTROSTATIC  
DISCHARGE SENSITIVITY  
PACKAGE/ORDERING INFORMATION  
Any integrated circuit can be damaged by ESD. Burr-Brown  
recommends that all integrated circuits be handled with  
appropriate precautions. Failure to observe proper handling  
and installation procedures can cause damage.  
PACKAGE  
DRAWING TEMPERATURE  
NUMBER(1)  
PRODUCT  
PACKAGE  
RANGE  
BUF634P  
BUF634U  
BUF634T  
BUF634F  
8-Pin Plastic DIP  
SO-8 Surface-Mount  
5-Lead TO-220  
006  
182  
315  
325  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
ESD damage can range from subtle performance degrada-  
tion to complete device failure. Precision integrated circuits  
may be more susceptible to damage because very small  
parametric changes could cause the device not to meet  
published specifications.  
5-Lead DDPAK  
NOTE: (1) For detailed drawing and dimension table, please see end of data  
sheet, or Appendix C of Burr-Brown IC Data Book.  
®
3
BUF634