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ADS7830IPWR 参数 Datasheet PDF下载

ADS7830IPWR图片预览
型号: ADS7830IPWR
PDF下载: 下载PDF文件 查看货源
内容描述: 8位, 8通道采样模拟数字转换器与I2C⑩接口 [8-Bit, 8-Channel Sampling ANALOG-TO-DIGITAL CONVERTER with I2C⑩ Interface]
分类和应用: 转换器光电二极管PC
文件页数/大小: 16 页 / 249 K
品牌: BURR-BROWN [ BURR-BROWN CORPORATION ]
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ADS7830
ADS
783
0
®
SBAS302 – DECEMBER 2003
8-Bit, 8-Channel Sampling
ANALOG-TO-DIGITAL CONVERTER
with I
2
C
Interface
FEATURES
q
q
q
q
q
q
q
70kHz SAMPLING RATE
±
0.5LSB INL/DNL
8 BITS NO MISSING CODES
4 DIFFERENTIAL/8 SINGLE-ENDED INPUTS
2.7V TO 5V OPERATION
BUILT-IN 2.5V REFERENCE/BUFFER
SUPPORTS ALL THREE I
2
C MODES:
Standard, Fast, and High-Speed
q
LOW POWER:
180
µ
W (Standard Mode)
300
µ
W (High-Speed Mode)
675
µ
W (Fast Mode)
q
DIRECT PIN COMPATIBLE WITH ADS7828
q
TSSOP-16 PACKAGE
APPLICATIONS
q
q
q
q
q
VOLTAGE-SUPPLY MONITORING
ISOLATED DATA ACQUISITION
TRANSDUCER INTERFACE
BATTERY-OPERATED SYSTEMS
REMOTE DATA ACQUISITION
DESCRIPTION
The ADS7830 is a single-supply, low-power, 8-bit data
acquisition device that features a serial I
2
C interface and an
8-channel multiplexer. The Analog-to-Digital (A/D) converter
features a sample-and-hold amplifier and internal,
asynchronous clock. The combination of an I
2
C serial,
2-wire interface and micropower consumption makes the
ADS7830 ideal for applications requiring the A/D converter to
be close to the input source in remote locations and for
applications requiring isolation. The ADS7830 is available in
a TSSOP-16 package.
CH0
CH1
CH2
CH3
CH4
CH5
CH6
CH7
COM
S/H Amp
Comparator
CDAC
Serial
Interface
SDA
SCL
A0
A1
8-Channel
MUX
SAR
2.5V V
REF
REF
IN
/REF
OUT
Buffer
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 2003, Texas Instruments Incorporated
www.ti.com